Dummy Data Line Openings for Display Device Short Circuit Prevention
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Solution Overview
Problem
Display devices face challenges in preventing short circuits between wires on different layers, leading to increased costs due to late detection of defects during manufacturing processes.
Innovation Solution
Incorporating a dummy data line and dummy reference voltage line with strategically placed openings near overlapping portions with gate lines, which are electrically insulated, to minimize the risk of short circuits and facilitate early defect detection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If wires on different layers are electrically insulated by an insulating layer, then electrical isolation is achieved, but short circuits may still occur due to defects in deposition and etching processes
Solution Approach 1:
The patent introduces dummy data lines with openings at overlapping portions with gate lines before final testing. This preliminary structural design allows defects to manifest earlier in the manufacturing process, enabling detection before costly final assembly and reducing the risk of short circuits in operational wires.
Solution Approach 2:
The dummy data line acts as an intermediary test structure that mediates between the manufacturing process and final product testing. By placing openings in the dummy data line at overlapping portions, it serves as a test vehicle to detect potential short circuit defects without affecting the functional data lines.
2Measurement precision
If defects are detected in later stages of manufacturing, then comprehensive testing is performed, but loss cost increases due to discarding devices
Solution Approach 1:
The dummy data line structure enables preliminary defect detection at an earlier stage in the manufacturing process. By designing openings in the dummy data line that overlap with gate lines, defects can be identified before subsequent manufacturing steps, reducing waste and cost.
Solution Approach 2:
The dummy data line is a copy or replica of the functional data line structure, designed specifically for testing purposes. It replicates the overlapping geometry with gate lines to simulate potential defect conditions, allowing defect detection without testing the actual functional wires.
3Reliability
If dummy data line includes openings near overlapping portions with gate line, then short circuit risk is reduced, but device structure becomes more complex
Solution Approach 1:
The dummy data line is segmented with openings at specific overlapping portions with gate lines. This segmentation creates discrete test points that can detect short circuit risks without requiring complex modifications to the entire device structure. The openings are strategically placed only where needed.
Solution Approach 2:
The dummy data line serves as a disposable or sacrificial test structure. It is designed to be simple and easy to manufacture with openings, serving its purpose as a test vehicle and then being discarded or left non-functional, while the main functional wires remain intact and unaffected.
Data Source
AI summary
The present disclosure relates to a display device including a substrate, a gate line on the substrate, a data line crossing the gate line, a pixel connected to the gate line and the data line, and a dummy data line disposed at an edge on the substrate and crossing the gate line, wherein the dummy data line includes openings that is disposed on a portion that is near an overlapping portion with the gate line, and portions of the dummy data line separated by the openings are electrically insulated from each other.