Dummy Electrostatic Induction Element for LCD Panel Protection

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Solution Overview

Problem

After the cutting process by a cell region, LCDs are vulnerable to electrostatic defects due to the loss of electrostatic induction function in the array substrate, leading to defects in driving elements or signal lines, which can result in faulty liquid crystal panels even if they have no defects in the display region.

Innovation Solution

Incorporating a dummy device, either as a dummy pattern or dummy test transistor, in the non-display region of the array substrate to act as an electrostatic induction element, which induces electrostatic charges away from the display region, thereby preventing defects caused by static electricity.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If the array substrate is cut by cell region after manufacturing, then individual display panels are produced, but the electrostatic induction function is lost and the substrate becomes vulnerable to electrostatic defects

Engineering Contradiction:
Improveindividual panel productionVSAvoidelectrostatic protection
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The patent divides the electrostatic protection function into two independent parts: the electrostatic induction line (EIDL) that collects charges and the dummy device that provides continuous discharge path. This segmentation allows the EIDL to be removed after cutting while the dummy device remains to maintain electrostatic protection in each individual panel.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The dummy device is formed in advance during the manufacturing process before cutting, positioned in the non-display region. This preliminary action ensures that even after the EIDL is removed by cutting, the dummy device already exists to provide continuous electrostatic charge discharge capability.

Inventive Principle:
Principle #10Preliminary action

2Device complexity

If the electrostatic induction line is removed after cutting, then the non-display region is simplified, but electrostatic charges can damage driving elements or signal lines in the display region

Engineering Contradiction:
Improvenon-display region structureVSAvoidelectrostatic damage to driving elements
Core Design Contradiction:
Device complexityVSObject-affected harmful factors

Solution Approach 1:

The dummy device acts as an intermediary element between the non-display region and the display region. It provides a safe discharge path for electrostatic charges, preventing them from reaching and damaging the driving elements or signal lines in the display region, thus mediating the harmful electrostatic effect.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent converts the potentially harmful electrostatic charges into a beneficial discharge process by providing the dummy device as a designated discharge path. Instead of allowing charges to randomly damage sensitive components, the dummy device guides charges to discharge safely in the non-display region, turning a harmful factor into a controlled protective mechanism.

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

3Reliability

If dummy devices are added to the non-display region, then electrostatic protection is maintained after cutting, but the non-display region area increases

Engineering Contradiction:
Improveelectrostatic protection after cuttingVSAvoidnon-display region area
Core Design Contradiction:
ReliabilityVSArea of stationary object

Solution Approach 1:

The dummy device is positioned specifically in the non-display region where it is needed for electrostatic protection, while the display region maintains its original quality and functionality. This local quality approach ensures electrostatic protection is provided exactly where required without affecting the display region.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The dummy device is designed to replicate the essential electrostatic induction function without requiring the full complexity of the original EIDL structure. By copying only the necessary charge collection and discharge capability in a simplified form, the patent achieves protection with minimal area occupation in the non-display region.

Inventive Principle:
Principle #26Copying

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This solution effectively prevents electrostatic defects in the display region by redirecting charges into the dummy devices, ensuring that even excessive electrostatic discharges do not affect the signal transfer lines or test transistors, thus maintaining the integrity of the liquid crystal panel.

Implementation Method 1

a dummy device in the form of either a dummy pattern and/or a dummy test transistor, functioning as an electrostatic induction element

Methodology Applied
Scientific EffectElectrostatic induction: Electrostatic Induction

Data Source

PatentUS10546781B2Display device
Publication Date: 2020.01.28 LG DISPLAY CO LTD
  • US10546781B2 patent drawing
  • US10546781B2 patent drawing
  • US10546781B2 patent drawing

AI summary

Disclosed is a display device that includes an array substrate that includes a display region and a first non-display region, and includes a signal line connected to a pixel in the display region; a first signal transfer line that is at the first non-display region and transfers a test signal, and a second signal transfer line that transfers a test enable signal; a connection pattern connected to the first signal transfer line; a test transistor that is connected between the signal line and the connection pattern, and is connected to the second signal transfer line; and an electrostatic induction element that includes a dummy device in the form of either a dummy pattern and/or a dummy test transistor, the dummy pattern including a dummy connection pattern connected to the first signal transfer line, the dummy test transistor connected to the second signal transfer line.