Dummy Layer Thickness Compensation in Display Manufacturing

The patent applies preliminary action by forming a dummy layer that replicates the optical properties of the actual functional layer before the final layer deposition. This dummy layer serves as a test substrate for thickness measurement and optical characteristic verification, allowing the manufacturing process to pre-adjust parameters before committing to the actual functional layer formation, thereby ensuring precision without requiring complex real-time control systems

The dummy layer acts as an intermediary element between the manufacturing process and the final product quality. It mediates the thickness control by providing a surrogate structure that can be measured and adjusted without affecting the actual functional layer directly. The measurement portion interacts with this intermediary to infer the thickness of the subsequent functional layer, simplifying the overall measurement and control system

The patent implements feedback control by measuring the thickness of the dummy layer with the measurement portion, comparing it against target specifications, and automatically adjusting the deposition process parameters for the subsequent functional layer. This closed-loop feedback system ensures uniform display device quality by compensating for thickness variations without requiring overly complex manual intervention systems

The dummy layer serves as a copy or replica of the functional layer's optical and physical characteristics. By creating this copy beforehand, the system can perform measurements and optimizations on the duplicate structure, then apply the learned parameters to the actual functional layer formation. This copying approach simplifies the measurement system since it only needs to characterize the dummy layer rather than directly measuring the delicate functional layer during deposition