Floating Dummy Oxide Semiconductor Layer for Transistor Stability

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Solution Overview

Problem

Oxide semiconductor transistors in display devices face degradation due to insufficient oxidation of the channel forming region, caused by oxygen extraction from the semiconductor layer by metal lines, leading to shifted threshold values and poor switching characteristics.

Innovation Solution

Incorporating a dummy oxide semiconductor layer that is electrically floating and disposed close to the transistor, which supplies oxygen to prevent deoxidization of the semiconductor layer, thereby reducing oxygen extraction and maintaining transistor stability.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If metal lines are disposed close to the oxide semiconductor layer, then electrical connection and signal transmission are achieved, but oxygen is extracted from the semiconductor layer causing threshold value shift and poor switching characteristics

Engineering Contradiction:
Improvetransistor switching characteristicsVSAvoidoxygen extraction by metal lines
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

A dummy oxide semiconductor layer is introduced as an intermediary between the metal lines and the functional oxide semiconductor layer. This dummy layer acts as a buffer that supplies oxygen to prevent oxygen extraction from the functional layer, thereby maintaining transistor switching characteristics while allowing metal lines to be disposed close to the semiconductor structure for electrical connection.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The dummy oxide semiconductor layer is formed in advance during the manufacturing process, specifically after forming the oxide semiconductor layer and before disposing metal lines. This preliminary formation ensures that oxygen supply capability is established before oxygen extraction by metal lines occurs, preventing threshold value shift and maintaining reliable switching characteristics.

Inventive Principle:
Principle #10Preliminary action

2Stability of the object's composition

If the oxide semiconductor layer is sufficiently oxidized, then transistor threshold values remain stable, but manufacturing complexity increases due to additional oxidation processes

Engineering Contradiction:
Improveoxide semiconductor layer oxidation stateVSAvoidmanufacturing process complexity
Core Design Contradiction:
Stability of the object's compositionVSDevice complexity

Solution Approach 1:

The dummy oxide semiconductor layer serves as a self-sustaining oxygen reservoir that automatically supplies oxygen to the functional oxide semiconductor layer during device operation and storage. This self-service mechanism maintains the oxidation state of the functional layer without requiring continuous external oxidation processes, thereby stabilizing transistor threshold values while avoiding additional manufacturing complexity.

Inventive Principle:
Principle #25Self-service

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The dummy oxide semiconductor layer effectively suppresses oxygen extraction, maintaining the stability and performance of oxide semiconductor transistors, ensuring long-term retention of electric charge and desired voltage in display devices.

Implementation Method 1

a dummy oxide semiconductor layer that is electrically floating and disposed close to the transistor, which supplies oxygen to prevent deoxidization of the semiconductor layer

Methodology Applied
Scientific EffectOxygen diffusion: Diffusion

Data Source

PatentUS11682732B2Semiconductor substrate and display device
Publication Date: 2023.06.20 MAGNOLIA WHITE CORP
  • US11682732B2 patent drawing
  • US11682732B2 patent drawing
  • US11682732B2 patent drawing

AI summary

According to one embodiment, a semiconductor layer includes a base, a scanning line disposed over the base, a signal line disposed over the base, a transistor overlapping the scanning line and the signal line and including a first oxide semiconductor layer connected to the signal line, and second oxide semiconductor layers disposed in a same layer as the first oxide semiconductor layer. The second oxide semiconductor layers are disposed around the transistor, and the second oxide semiconductor layers are floating.