Repurposed Dummy Transistors for Hold-Slack Correction
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing methods for addressing hold-slack violations in semiconductor devices, particularly in the context of advanced technology nodes with smaller time scales (less than about 5 psec), are ineffective, as they either enlarge the circuit footprint or introduce timing uncertainties, making them unsuitable for high-performance integrated circuits.
Innovation Solution
The method involves repurposing disconnected dummy devices within the circuit as connected passive devices (DD2CP method) to mitigate hold-slack violations without enlarging the circuit footprint, specifically by converting shorted transistors to capacitor-configured transistors and connecting them to target nodes within the active circuit.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If conventional methods are used to address hold-slack violations, then timing reliability is improved, but circuit footprint increases
Solution Approach 1:
The patent recovers discarded dummy transistors that were previously removed or deactivated. These dummy transistors are reactivated and repurposed as functional delay elements to address hold-slack violations, thereby eliminating the need to add new circuit elements and avoiding footprint increase.
Solution Approach 2:
The dummy transistors, originally serving no functional purpose, are made to serve themselves by becoming active delay elements. The existing dummy transistor structures provide the timing correction function without requiring external additions, making the system self-sufficient.
2Reliability
If conventional methods are used to address hold-slack violations, then timing reliability is improved, but device complexity increases
Solution Approach 1:
The patent recovers discarded dummy transistors that were previously removed or deactivated. These dummy transistors are reactivated and repurposed as functional delay elements to address hold-slack violations, thereby eliminating the need to add new circuit elements and avoiding footprint increase.
Solution Approach 2:
The dummy transistors are transformed from non-functional structures to multi-functional elements that serve both as part of the original circuit layout (maintaining design rule compliance) and as active delay elements for timing correction, reducing the need for additional dedicated timing correction circuits.
3Measurement precision
If conventional methods are used to address hold-slack violations, then timing accuracy is improved, but manufacturing precision requirements increase
Solution Approach 1:
The dummy transistors are designed and positioned during the initial layout phase with predetermined characteristics that inherently provide the required delay. This preliminary configuration ensures that the timing correction function is built-in without requiring post-fabrication adjustments or highly precise manufacturing variations.
Solution Approach 2:
The patent utilizes changes in transistor parameters (such as width, length, or configuration) of the dummy transistors to precisely control the delay characteristics. By adjusting these parameters during design, accurate timing control is achieved without imposing stringent manufacturing precision requirements.
Data Source
AI summary
A semiconductor device includes a cell region configured as a functional circuit. The cell region includes active transistors which are arranged to fit within a rectangular area. One or more of the active transistors is configured correspondingly to receive data at a data-input node of the cell region and a clock at a timing-input node of the cell region, and one or more of the active transistors being configured to produce an output signal at an output node of the cell region. One or more capacitor-configured transistors is arranged within the rectangular area, a terminal of one or more of the capacitor-configured transistors being connected to a target node of the functional circuit