Duplex Fiber-Optic Adapter Tip for Simultaneous Ferrule Imaging

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Existing optical-fiber connector endface inspection microscopes struggle to image both ferrules of a duplex connector simultaneously due to the wide field of view requirements, often necessitating complex and alignment-prone optical components.

Innovation Solution

An adapter tip with relay optics that laterally shifts the optical path of one light beam to align with the other, allowing both ferrules to be imaged concurrently within the microscope's field of view, using a compact and cost-effective design with integrated wedge holders.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Area of stationary object

If a typical single-fiber or multi-fiber inspection microscope is used, then the microscope can inspect single-fiber or multi-fiber connectors, but the field of view is too narrow to image both ferrules of a duplex connector at once

Engineering Contradiction:
Improvefield of view widthVSAvoidoptical path configuration
Core Design Contradiction:
Area of stationary objectVSDevice complexity

Solution Approach 1:

The adapter tip is divided into separate optical path channels - a first optical path for the first ferrule and a second optical path for the second ferrule. Each channel can be independently configured with relay optics, allowing the system to handle the wide field of view requirement by segmenting the imaging task into manageable separate paths that are later combined.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent introduces a lateral dimension to the optical path by using relay optics that shift the optical path of one ferrule laterally to align with the other ferrule's optical path. This dimensional transformation allows both ferrules to be imaged within the constrained field of view of the existing microscope without requiring a completely new wide-field objective lens.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Productivity

If relay optics are added to laterally shift optical paths, then both ferrules can be imaged concurrently, but the device complexity and alignment difficulty increase

Engineering Contradiction:
Improveinspection efficiencyVSAvoidoptical component configuration
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The adapter tip serves as an intermediary device between the duplex connector and the microscope. It incorporates relay optics that act as mediators to laterally shift and align the optical paths from both ferrules, enabling concurrent imaging without requiring modifications to the microscope itself. This intermediary approach maintains productivity while managing device complexity by isolating the optical path manipulation in a separate, replaceable component.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The relay optics in the adapter tip provide dynamic optical path adjustment capability. The optical paths can be laterally shifted and aligned to accommodate different duplex connector types and configurations, allowing the system to adapt to various inspection scenarios while maintaining concurrent imaging capability. This dynamic flexibility improves productivity without permanently increasing the base microscope's complexity.

Inventive Principle:
Principle #15Dynamics

3Area of stationary object

If the field of view is increased to cover both ferrules, then simultaneous imaging is possible, but the microscope design becomes more complex and costly

Engineering Contradiction:
Improvefield of view widthVSAvoidmicroscope design simplicity
Core Design Contradiction:
Area of stationary objectVSEase of manufacture

Solution Approach 1:

Rather than designing a single complex wide-field microscope, the patent segments the field of view requirement into two separate optical paths within the adapter tip, each corresponding to one ferrule. The existing microscope's narrower field of view is sufficient for each segmented path, avoiding the need to manufacture a new wide-field microscope while still achieving simultaneous imaging of both ferrules.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent solves the field of view limitation by introducing lateral optical path shifting through relay optics in the adapter tip. Instead of increasing the microscope's field of view in the lateral dimension, it manipulates the optical paths to bring both ferrule images into the existing field of view, thereby maintaining ease of manufacture while achieving the desired simultaneous imaging capability.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables simultaneous imaging of both ferrules with improved focus adjustment, reducing assembly complexity and misalignment risks while maintaining image quality.

Implementation Method 1

relay optics configured to laterally shift the optical path of the light beam reflected from one optical fiber endface (corresponding the first ferrule) toward that from the other optical fiber endface (corresponding the second ferrule)

Methodology Applied
Scientific EffectOptical path lateral shifting: Refraction

Data Source

PatentUS12429653B2Adapter tip and microscope system for inspecting duplex fiber-optic connector endfaces
Publication Date: 2025.09.30 EXFO
  • US12429653B2 patent drawing
  • US12429653B2 patent drawing
  • US12429653B2 patent drawing

AI summary

There is provided an adapter tip to be employed with an optical-fiber connector-endface inspection microscope device and an optical-fiber connector endface inspection microscope system suitable for imaging the endface of a duplex optical-fiber connector. Because of the distance between the ferrules of a duplex connector, the field of view of a typical single-fiber or multi-fiber inspection microscope may not be wide enough to allow inspection of both ferrules at once. The proposed adapter tip or microscope system may comprise relay optics configured to laterally shift the optical path of the light beam reflected from one optical fiber endface (corresponding the first ferrule) toward that from the other optical fiber endface (corresponding the second ferrule), so that both endfaces may be imaged within the field of view of the inspection microscope.