Duplex Fiber Connector Adapter Tip for Dual Endface Imaging
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing optical-fiber connector endface inspection microscopes struggle to simultaneously inspect the two ferrules of duplex connectors within a single field of view due to their wide spacing, leading to potential misalignment and focus discrepancies.
Innovation Solution
An adapter tip with relay optics is introduced to laterally shift the optical paths of light beams reflected from each ferrule, allowing both endfaces to be imaged concurrently within the microscope's field of view, and in cases of focus discrepancies, capturing separate images with adjusted focus for each endface.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Area of stationary object
If a typical single-fiber or multi-fiber inspection microscope is used, then the field of view covers a standard area, but the two distant ferrules of a duplex connector cannot be inspected at once
Solution Approach 1:
The patent introduces relay optics that laterally shift the optical path of light beams reflected from one ferrule toward the other ferrule. This dimensional transformation of the optical path allows both ferrules to be imaged within the standard field of view area without requiring a larger microscope field of view.
Solution Approach 2:
The relay optics act as an intermediary element between the ferrules and the microscope's imaging system. By inserting this optical intermediary, the system can capture images of both ferrules simultaneously within the existing field of view constraints.
2Ease of operation
If relay optics are added to laterally shift optical paths, then both ferrules can be imaged at once, but the device complexity increases
Solution Approach 1:
The adapter tip is divided into distinct functional components: a body portion, a cap portion, and relay optics. This segmentation allows the complex relay optics to be isolated within the adapter tip, keeping the main microscope system simple while enabling simultaneous ferrule inspection through the add-on component.
Solution Approach 2:
The relay optics are nested within the adapter tip structure, which itself attaches to the microscope. This nested configuration contains the optical complexity within a compact, self-contained unit that does not increase the overall system footprint or operational complexity.
3Area of stationary object
If the field of view is expanded to cover both ferrules, then simultaneous inspection is possible, but the microscope design becomes more complex
Solution Approach 1:
Rather than expanding the field of view area, the patent transforms the optical paths laterally using relay optics. This approach achieves the equivalent effect of a wider field of view by redistributing the optical information spatially, without requiring a larger or more complex microscope field of view system.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables simultaneous inspection of duplex connector ferrules with improved focus alignment and reduced component complexity, minimizing misalignments and assembly time while maintaining image quality.
Implementation Method 1
relay optics configured to laterally shift the optical path of a light beam reflected from one optical fiber endface toward that from the other optical fiber endface
Data Source
Figure 1A~1B
Figure 2
Figure 3
AI summary
There is provided an adapter tip to be employed with an optical-fiber connector-endface inspection microscope device and an optical-fiber connector endface inspection microscope system suitable for imaging the endface of a duplex optical-fiber connector. Because of the distance between the ferrules of a duplex connector, the field of view of a typical single-fiber or multi-fiber inspection microscope may not be wide enough to allow inspection of both ferrules at once. The proposed adapter tip or microscope system may comprise relay optics configured to laterally shift the optical path of the light beam reflected from one optical fiber endface (corresponding the first ferrule) toward that from the other optical fiber endface (corresponding the second ferrule), so that both endfaces may be imaged within the field of view of the inspection microscope.