Dustproof Test Chamber With Controlled Dust Fall and Humidity
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Solution Overview
Problem
Existing electronic products fail due to corrosion and short circuits caused by dust, temperature, and humidity in non-hermetic environments, necessitating a reliable test method to assess their durability.
Innovation Solution
A dustproof test device with a test box, dust supply apparatus, and flow control system to simulate dust fall under gravity, adjust dust concentration, and control temperature and humidity, ensuring even dust distribution and environmental simulation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Quantity of substance
If dust is supplied into the test box using conventional methods, then dust can be introduced into the sample cabin, but the dust distribution is uneven and too much dust accumulates requiring complex collection and reuse systems
Solution Approach 1:
The patent extracts the dust accumulation problem by separating the dust supply function from the test environment. A dust supply apparatus is introduced that delivers dust through a dust tube directly to the sample cabin, allowing dust to naturally fall and accumulate only where needed rather than requiring complex collection and reuse systems throughout the entire test box.
Solution Approach 2:
The dust tube serves as an intermediary component that transports dust from the supply apparatus to the sample cabin. This intermediary structure enables controlled dust delivery and allows dust to naturally fall into the sample cabin under gravity, simplifying the overall system by eliminating the need for complex dust collection and redistribution mechanisms.
2Productivity
If compressed air is used to transport dust, then dust can be delivered to the sample cabin, but dust concentration control becomes difficult
Solution Approach 1:
The patent implements a flow control system that monitors and adjusts the compressed air flow to the dust supply apparatus. This feedback mechanism ensures that dust is transported efficiently into the sample cabin while maintaining controlled dust concentration, preventing both over-supply and under-supply of dust during the test process.
3Reliability
If a large volume of dust is used to simulate real-world conditions, then the test accuracy improves, but the test box requires larger space and longer cleaning time
Solution Approach 1:
The patent applies local quality by concentrating dust accumulation specifically within the sample cabin rather than distributing it throughout the entire test box. The dust supply apparatus targets dust delivery precisely where needed, allowing realistic dust concentration tests while minimizing the overall space required and reducing cleaning requirements for areas outside the sample cabin.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The device effectively tests the dust and humidity resistance of electronic products, simulating real-world conditions to identify and improve their reliability and durability.
Implementation Method 1
the dust supply apparatus is configured to transport dust into the sample cabin under the action of compressed air
Implementation Method 2
the dust naturally falls in the sample cabin under gravity
Data Source
Figure 1
Figure 2
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AI summary
Embodiments of the present invention disclose a dustproof test device, including a test box and a dust supply apparatus, where the test box includes a sample cabin, the dust supply apparatus is connected to the test box through a dust tube, and the dust supply apparatus is configured to transport dust into the sample cabin under the action of compressed air. The embodiments of the present invention further provide a dustproof test method. According to the dustproof test device and method provided in the embodiments of the present invention, a reliability growth test can be performed on an electronic product.