DUT Temperature Calibration via Computational Adjustment
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Solution Overview
Problem
The existing methods for calibrating temperature sensors in semiconductor chips require a lengthy trimming process, which is time-consuming and inefficient during device testing.
Innovation Solution
An electronic component handling apparatus that calculates the temperature of a DUT based on detection values from a temperature detection circuit, performs calibrations before and after the DUT is turned on, and adjusts the temperature accordingly, eliminating the need for the trimming process.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If temperature calibration is performed by trimming the variable resistor, then the temperature sensor can be calibrated to eliminate manufacturing variations, but the testing time becomes excessively long
Solution Approach 1:
The patent replaces the mechanical trimming process with a computational calibration method. Instead of physically adjusting the variable resistor through mechanical means, the system uses a calibration curve stored in memory and computational algorithms to determine the actual temperature based on voltage division ratios, thereby eliminating the time-consuming mechanical trimming step while maintaining measurement precision
Solution Approach 2:
The patent performs preliminary calibration during the manufacturing process where standard temperatures are measured and calibration curves are stored in memory. This preliminary action eliminates the need for time-consuming trimming during actual testing, as the calibration data is pre-prepared and ready for rapid lookup and computation during device testing
Data Source
AI summary
An electronic component handling apparatus pressing the DUT against a socket electrically connected to a tester, includes: a first receiver that receives, from the tester, a first signal indicating a detection value of a temperature detection circuit; a calculator that calculates a temperature of the DUT based on the first signal; a calibrator that calibrates the calculated temperature; a second receiver that receives, from the tester, a second signal that causes the calibrator to start a first calibration; and a temperature adjuster that adjusts the temperature of the DUT. The second receiver receives the second signal before the tester turns on the DUT, once the second signal is received, the calibrator calculates a first calibrated temperature by executing the first calibration with respect to the calculated temperature, and the temperature adjuster adjusts the temperature of the DUT based on the first calibrated temperature.