Unified DUT Characterization Platform for Static-Dynamic Switching
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Solution Overview
Problem
Conventional characterization of semiconductor devices, particularly high power FETs, requires separate static and dynamic measurement platforms, complicating the process and posing safety challenges due to SOA limitations.
Innovation Solution
A unified measurement system combining static and dynamic characterization capabilities in a single platform, featuring a test and measurement device and a power delivery and measurement front end, allowing for safe, portable, and automated switching between measurement configurations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If separate static and dynamic measurement platforms are used, then measurement precision is maintained, but device complexity and ease of operation deteriorate
Solution Approach 1:
The patent combines separate static and dynamic measurement platforms into a single integrated measurement system. The system uses a unified hardware platform with integrated power delivery, voltage sensing, and current sensing capabilities that can perform both static I/V curve measurements and dynamic switching characterization without requiring multiple separate instruments or setups.
Solution Approach 2:
The measurement system is designed with universal functionality to perform multiple types of device characterization through a single platform. The system can automatically switch between static characterization mode (for I/V curves) and dynamic characterization mode (for switching parameters), eliminating the need for dedicated separate platforms for each measurement type.
2Measurement precision
If separate static and dynamic measurement platforms are used, then measurement precision is maintained, but ease of operation deteriorates
Solution Approach 1:
The patent combines separate static and dynamic measurement platforms into a single integrated measurement system. The system uses a unified hardware platform with integrated power delivery, voltage sensing, and current sensing capabilities that can perform both static I/V curve measurements and dynamic switching characterization without requiring multiple separate instruments or setups.
Solution Approach 2:
The measurement system incorporates automated dynamic configuration capabilities that allow it to adapt its measurement parameters, waveforms, and analysis methods based on the selected characterization mode. This dynamic adaptability simplifies operation by eliminating manual reconfiguration between static and dynamic measurements while maintaining measurement precision through automated parameter optimization.
3Reliability
If dedicated custom dynamic platform is used for high power devices, then reliability is improved, but device complexity increases
Solution Approach 1:
The measurement system is designed with universal functionality to perform multiple types of device characterization through a single platform. The system can automatically switch between static characterization mode (for I/V curves) and dynamic characterization mode (for switching parameters), eliminating the need for dedicated separate platforms for each measurement type.
Solution Approach 2:
The integrated system incorporates real-time monitoring and feedback mechanisms that track device operation within safe operating area (SOA) limits. The system uses coordinated control of voltage and current waveforms with automated protection logic that responds to device behavior, ensuring reliable high-power characterization while maintaining SOA compliance without requiring overly complex dedicated hardware.
Data Source
AI summary
A test and measurement system includes a power device having an interface to allow connection to one or more devices under test (DUTs), and one or more processors configured to execute code that, when executed, causes the one or more processors to receive a selection between static and dynamic characterization, and to configure the power device to perform the selected one of static or dynamic characterization of the one or more DUTs, a measurement device, having a user interface, one or more processors configured to execute code that, when executed, causes the one or more processors to: receive user inputs through the user interface, the user inputs including at least the selection between static and dynamic characterization, and send the selected one of static or dynamic characterization to the power device, and a connector to connect the power device to the measurement device.