Independent Contact Units for DUT Temperature and Pressing

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Solution Overview

Problem

The existing electronic component handling apparatuses face challenges in increasing operation rates and reducing occupied space as the number of simultaneous measurements increases, leading to longer standby times and potential failures, especially when dealing with varying test loads.

Innovation Solution

The apparatus features independently adjustable contact units for temperature control and pressing, with a tray transport system that allows for vertical and horizontal movement, enabling flexible configuration and optimization of contact units based on test requirements, allowing for the division of simultaneous measurements into multiple units for efficient testing.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If the number of simultaneous measurements is increased, then the productivity is improved, but the standby time increases and the operation rate decreases

Engineering Contradiction:

Improvenumber of simultaneous measurementsVSAvoidstandby time

Core Design Contradiction:

ProductivityVSLoss of time

Solution Approach 1:

The chamber part is divided into multiple independent contact units (first contact unit and second contact unit), each capable of independently pressing and testing DUTs. This segmentation allows parallel processing of multiple trays simultaneously, reducing standby time while maintaining high measurement capacity.

Inventive Principle:

Principle #1Segmentation

2Productivity

If the number of simultaneous measurements is increased, then the productivity is improved, but the reliability decreases due to increased failure probability

Engineering Contradiction:

Improvenumber of simultaneous measurementsVSAvoidfailure probability

Core Design Contradiction:

ProductivityVSReliability

Solution Approach 1:

By dividing the chamber into independent contact units, the system isolates potential failures to specific units rather than affecting the entire system. If one contact unit fails, other units can continue operating, thereby maintaining reliability while achieving high simultaneous measurement capacity.

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

Each contact unit is equipped with independent temperature control and pressing mechanisms tailored to its specific function. This localized optimization ensures that each unit operates at peak performance with appropriate error margins, reducing overall failure probability while maintaining high productivity.

Inventive Principle:

Principle #3Local quality

3Productivity

If the chamber part is configured for high simultaneous measurements, then the productivity is improved, but the occupied space increases

Engineering Contradiction:

Improvenumber of simultaneous measurementsVSAvoidoccupied space

Core Design Contradiction:

ProductivityVSArea of stationary object

Solution Approach 1:

The contact units are arranged in a vertical configuration within the chamber, utilizing the vertical dimension to accommodate multiple testing positions. This three-dimensional arrangement allows high simultaneous measurement capacity without proportionally increasing the horizontal occupied space of the apparatus.

Inventive Principle:

Principle #17Another dimension (Dimensionality change)

Data Source

PatentUS11579189B2Electronic component handling apparatus and electronic component testing apparatus

Publication Date: 2023.02.14 ADVANTEST CORP

AI summary

An electronic component handling apparatus handles a device under test (DUT). The electronic component handling apparatus includes: contact units that adjust a temperature of the DUT independently from one another and press the DUT against a socket independently from one another. The socket is disposed on a test head that is mounted to each of the contact units and that is connected to a tester. At least one of the contact units is removably disposed on the electronic component handling apparatus.