DUT Control Circuitry for Wireless Transceiver Testing
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Solution Overview
Problem
Current wireless device test systems require increasingly sophisticated testers to accommodate varied performance characteristics of DUTs, leading to higher manufacturing costs due to the need for reconfiguring or reprogramming equipment.
Innovation Solution
A system and method that utilize DUT control circuitry separate from the tester to execute test program instructions, allowing for specialized testing of different DUTs with various chipsets using a standard tester configuration without reconfiguration or reprogramming, employing an external processing subsystem to manage test data packet and step sequencing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If increasingly sophisticated testers are employed to accommodate varied performance characteristics of DUTs, then testing capability and adaptability improve, but manufacturing cost increases
Solution Approach 1:
A separate DUT controller is introduced as an intermediary device between the standard tester and the DUT. This controller executes chipset-specific test sequences and manages DUT control signals, allowing the same standard tester to accommodate various DUT types without modification. The intermediary absorbs the complexity of adapting to different chipsets while keeping the tester itself simple and universal.
Solution Approach 2:
The testing system is segmented into three independent components: the standard tester, the separate DUT controller, and the DUT itself. The DUT controller handles all chipset-specific logic and control functions, while the tester provides only universal signal generation and measurement. This segmentation allows each component to be optimized independently, reducing overall system complexity and cost.
2Adaptability or versatility
If reconfiguration or reprogramming of tester equipment is performed to test different DUTs, then testing adaptability improves, but test time and operational complexity increase
Solution Approach 1:
The DUT controller is pre-programmed with chipset-specific test sequences and control logic before actual testing begins. When a new DUT type is introduced, the appropriate pre-configured controller is selected and connected, eliminating the need for on-the-fly reconfiguration of the tester. This preliminary preparation enables rapid switching between different DUT types without time-consuming reprogramming.
3Measurement precision
If specialized testing for different DUT chipsets is implemented, then measurement precision improves, but device complexity increases
Solution Approach 1:
The DUT controller serves as an intermediary that translates universal tester commands into chipset-specific control signals and manages the complex test sequences required for precise measurement of different DUT types. This mediator handles the complexity of chipset variations while maintaining a simple, universal tester interface.
Solution Approach 2:
The standard tester is designed with universal functionality to work with multiple DUT types through the DUT controller. The tester provides universal signal generation and measurement capabilities that can be applied to any DUT type, while the DUT controller provides the specialized functionality needed for different chipsets. This multi-functionality reduces overall system complexity by eliminating the need for multiple specialized testers.
Data Source
AI summary
A system and method for testing a wireless data packet signal transceiver device under test (DUT) by using DUT control circuitry separate from a tester to access and execute test program instructions for controlling the DUT during testing with the tester. The test program instructions can be provided previously and stored for subsequent access and execution under control of the tester or an external control source, such a personal computer. Alternatively, the test program instructions can be provided by the tester or external control source immediately prior to testing, such as when beginning testing of a DUT with new or different performance characteristics or requirements. Accordingly, specialized testing of different DUTs while accounting for differences among various chipsets employed by the DUTs can be performed in coordination with a standard tester configuration without need for reconfiguring or reprogramming of the tester.