Modular DUT PCB Socket Testing with Rack-and-Pinion Locking

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Solution Overview

Problem

Conventional testing systems are unable to efficiently test a variety of semiconductor chips with different electrical interconnects and DUT PCBs, requiring dedicated machines for each type, which is costly and inefficient in terms of space and time, and lack flexibility in configuration changes.

Innovation Solution

A modular electronic testing system with a removable DUT PCB that uses a locking mechanism with a rack and pinion arrangement for easy conversion between configurations, allowing quick and accurate testing of various electrical interconnects and DUT PCBs, while minimizing space and cost.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If conventional testing systems are used for each type of electrical interconnect, then testing accuracy is maintained, but device complexity and capital cost increase

Engineering Contradiction:
Improvetesting accuracyVSAvoidsystem complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The testing system uses a universal testing platform that can accommodate multiple types of electrical interconnects and DUT PCBs through a standardized interface and removable configuration system, eliminating the need for separate dedicated testing machines for each chip type while maintaining testing accuracy

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The testing system is divided into modular components including a base testing platform and interchangeable test configurations, allowing the system to be segmented and reconfigured for different testing requirements without increasing overall system complexity

Inventive Principle:
Principle #1Segmentation

2Adaptability or versatility

If dedicated testing machines are created for each semiconductor chip type, then testing capability is specialized, but loss of time and space efficiency worsen

Engineering Contradiction:
Improvetesting capabilityVSAvoidconversion time
Core Design Contradiction:
Adaptability or versatilityVSLoss of time

Solution Approach 1:

The testing system employs a dynamic reconfiguration capability where test configurations can be quickly changed and exchanged between different chip types, allowing the system to adapt to new testing requirements without time-consuming conversions or reconfigurations

Inventive Principle:
Principle #15Dynamics

3Adaptability or versatility

If multiple dedicated testing systems are deployed, then each chip type can be tested, but area of stationary object increases

Engineering Contradiction:
Improvechip type coverageVSAvoidcleanroom space
Core Design Contradiction:
Adaptability or versatilityVSArea of stationary object

Solution Approach 1:

A single universal testing system replaces multiple dedicated testing machines, providing the capability to test various chip types through removable configurations while occupying significantly less cleanroom space

Inventive Principle:
Principle #6Universality (Multi-functionality)

4Manufacturing precision

If custom DUT PCB and electrical interconnect are made for each chip, then manufacturing precision is optimized, but device complexity and cost increase

Engineering Contradiction:
Improvechip testing precisionVSAvoidPCB and interconnect complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The testing solution is segmented into a universal platform and interchangeable test configurations, allowing custom testing requirements to be met through modular additions rather than custom manufacturing of entire testing systems for each chip type

Inventive Principle:
Principle #1Segmentation

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The system enables rapid conversion between testing configurations, supports a wide range of interconnects, reduces space requirements, and lowers capital costs, providing high-quality, durable, and efficient testing.

Implementation Method 1

an actuating mechanism that includes a rack and pinion arrangement that converts rotational movement of the pinions to lateral movement of the racks

Methodology Applied
Scientific EffectRack and pinion: Rack and Pinion

Data Source

PatentUS12560643B2Modular electronic testing system with flexible test PCB format
Publication Date: 2026.02.24 MODUS TEST
  • US12560643B2 patent drawing
  • US12560643B2 patent drawing
  • US12560643B2 patent drawing

AI summary

A testing system for test sockets is presented having a removable device under test printed circuit board (DUT PCB) that electrically connects with the electrical testing components of the system. A top stiffener is attached to the lower surface of the DUT PCB and is locked in place by engagement members of a locking mechanism, that is operated by an actuating mechanism, that includes a rack and pinion arrangement that converts rotational movement of the pinions to lateral movement of the racks thereby locking the stiffener connected to the DUT PCB to the socket plate so as to facilitate testing. The upper surface of the DUT PCB has an infinite top plane that is uninterrupted and can be of any size and shape. The system is also modular and can be formed of any number of modules depending on the pin count density required.