DUT Power Management via Current Monitoring and Staggered Restart

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Solution Overview

Problem

Existing device-under-test (DUT) power management systems face inefficiencies due to constant power supply sizing based on worst-case current requirements, leading to underutilization during less current-intensive tests, resulting in wasted resources and prolonged testing times.

Innovation Solution

Implementing a system that monitors current draw during tests and cancels tests for subsets of DUTs exceeding a predetermined threshold, using a random heuristic algorithm to stagger restarts and manage power distribution efficiently, allowing for more DUTs to be tested concurrently without exceeding power limitations.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If power supply is sized according to worst-case current requirements, then power supply capacity is sufficient for all tests, but power supply capacity is largely unused during less current-intensive tests

Engineering Contradiction:
Improvepower supply capacity sufficiencyVSAvoidpower supply capacity utilization
Core Design Contradiction:
ReliabilityVSLoss of energy

Solution Approach 1:

The system dynamically adjusts the number of active DUTs being tested based on real-time current draw monitoring. When current exceeds the threshold, the system automatically reduces the number of active DUTs to maintain safe operating levels, and can increase the number of active DUTs when current demand decreases, thereby optimizing power supply utilization while maintaining reliability.

Inventive Principle:
Principle #15Dynamics

2Productivity

If power supply is sized according to worst-case current requirements, then all DUTs can be tested concurrently, but testing time is prolonged due to power limitations

Engineering Contradiction:
Improvenumber of DUTs tested concurrentlyVSAvoidtesting time
Core Design Contradiction:
ProductivityVSLoss of time

Solution Approach 1:

The system dynamically adjusts the number of active DUTs based on real-time current monitoring. When current exceeds the threshold, the system automatically reduces the number of active DUTs to maintain safe operating levels, and can increase the number of active DUTs when current demand decreases, thereby optimizing both power utilization and testing throughput.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The system implements periodic monitoring and adjustment cycles where current draw is continuously monitored, and the number of active DUTs is adjusted in periodic intervals based on whether the current threshold is exceeded, creating a rhythm of testing that optimizes both power usage and productivity.

Inventive Principle:
Principle #19Periodic action

3Reliability

If current draw is monitored and tests are cancelled for subsets of DUTs, then power limits are not exceeded, but test completion is interrupted

Engineering Contradiction:
Improvepower limit complianceVSAvoidtest interruption
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The system implements continuous feedback monitoring of current draw and automatically adjusts the number of active DUTs based on real-time current levels. When the current threshold is exceeded, the system feeds back this information and reduces the number of active DUTs accordingly, creating a closed-loop control system that maintains power compliance while minimizing test interruptions.

Inventive Principle:
Principle #23Feedback

Data Source

PatentUS8030959B2Device-under-test power management
Publication Date: 2011.10.04 TEXAS INSTRUMENTS INC
  • US8030959B2 patent drawing
  • US8030959B2 patent drawing
  • US8030959B2 patent drawing

AI summary

One embodiment of the present invention includes a system for managing power to a plurality of devices-under-test (DUTs). The system comprises a DUT test system configured to perform at least one test associated with operation of the DUTs and to monitor current associated the at least one test of the plurality of DUTs. The DUT test system can communicate an instruction to a subset of the plurality of DUTs to cancel the at least one test if the monitored current is greater than a predetermined threshold. Each of the plurality of DUTs can comprise restart logic configured to restart the at least one test of the subset of the plurality of DUTs after being cancelled in response to the instruction.