Automated DUT Receptacle Handling for Flexible Test Floor Systems
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Solution Overview
Problem
Current automated testing systems are inflexible and require separate setups for different devices and test conditions, limiting their ability to efficiently test various types of devices under diverse conditions.
Innovation Solution
An individualized automated testing environment is established using DUT receptacles, testing modules, and automated handling stations, which provide a uniform size and interface for devices of varying types and form factors, enabling flexible testing across different types, test types, and conditions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If separate testing setups are developed for different products, then testing accuracy for specific products is improved, but device complexity and time to set up testing increases
Solution Approach 1:
The patent implements a universal testing setup using standardized receptacles that can accommodate multiple device types through a common interface. The receptacle system allows different devices to be tested on the same test floor without requiring separate specialized setups, thereby reducing overall system complexity while maintaining testing accuracy through proper mechanical and electrical coupling.
Solution Approach 2:
The testing system is segmented into modular components: standardized receptacles, device adapters, and test modules. This segmentation allows the system to handle different device types by simply changing the receptacle or adapter configuration rather than redesigning the entire testing setup, thus improving accuracy for specific devices without proportionally increasing overall complexity.
2Reliability
If specialized testing equipment is used for specific device types, then testing reliability is improved, but adaptability to different device types decreases
Solution Approach 1:
The standardized receptacle design provides a universal interface that maintains reliable electrical and mechanical connections across different device types. The receptacle system incorporates consistent contact patterns and mounting mechanisms that ensure testing reliability regardless of the specific device being tested, while simultaneously enabling high adaptability to various form factors and specifications.
Solution Approach 2:
The receptacle acts as an intermediary component between the specialized testing equipment and the diverse devices being tested. It provides a standardized interface that translates between different device configurations and the fixed testing equipment requirements, thereby maintaining reliability of the testing equipment while enabling adaptability to different device types.
3Ease of operation
If manual handling and setup procedures are used, then ease of operation for complex devices is improved, but productivity and time efficiency decrease
Solution Approach 1:
Devices are pre-configured in standardized receptacles with pre-attached adapters and connectors before reaching the test floor. This preliminary preparation ensures that when devices arrive at the testing station, they are ready for immediate automated testing without requiring manual handling or setup adjustments, thereby maintaining ease of operation while significantly improving productivity and testing throughput.
Solution Approach 2:
The system replaces manual mechanical handling and setup procedures with automated conveyor-based transport and robotic insertion mechanisms. The standardized receptacle design enables automated systems to reliably handle, position, and connect devices without human intervention, thus maintaining operational simplicity while dramatically increasing testing productivity and reducing setup time.
Data Source
AI summary
In an embodiment, a test floor apparatus includes at least one conveyor, a vertical stack buffer, and an automated handling station. The vertical stack buffer is operable to hold a plurality of DUT (device under test) receptacles and operable to place a DUT receptacle on the at least one conveyor to enable a corresponding DUT to be inserted into the DUT receptacle. The automated handling station is operable to access the DUT receptacle from the at least one conveyor and is operable to open the DUT receptacle to position the corresponding DUT in a manner that couples the corresponding DUT to an electrical interface of the DUT receptacle and that encloses the corresponding DUT inside the DUT receptacle to facilitate testing of the corresponding DUT.