Duty Correction Counting Circuit for Fast Locking and Fine Tuning

Solution Overview

Problem

Existing duty correction circuits in semiconductor devices face challenges in balancing locking time and error correction, with binary search methods offering short locking times but large duty error changes, and linear search methods providing long locking times but small duty error corrections, leading to increased complexity when trying to implement both methods in a single circuit.

Innovation Solution

A counting circuit and duty correction circuit that selectively use either binary or linear search methods by controlling the toggling of counting clocks and adjusting duty correction codes, allowing for minimal area occupation and reduced error probability by switching between methods based on operational needs.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Loss of time

If binary search method is used to correct duty error, then locking time is shortened, but duty error changes occur in large units leading to reduced precision

Engineering Contradiction:

Improvelocking timeVSAvoidduty error precision

Core Design Contradiction:

Loss of timeVSMeasurement precision

Solution Approach 1:

The duty correction operation is divided into two distinct phases: initial duty correction using binary search method for rapid locking, and fine duty correction using linear search method for precise adjustment. This segmentation allows each phase to use the most appropriate algorithm for its specific requirements, resolving the contradiction between speed and precision.

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

The invention dynamically switches between binary search and linear search methods based on the current duty error magnitude. When duty error exceeds a threshold, binary search is used for fast correction; when duty error is within the threshold, linear search takes over for fine-tuning. This dynamic adaptation optimizes both locking time and precision throughout the correction process.

Inventive Principle:

Principle #15Dynamics

2Measurement precision

If linear search method is used to correct duty error, then duty error correction precision is improved, but locking time is extended

Engineering Contradiction:

Improveduty error precisionVSAvoidlocking time

Core Design Contradiction:

Measurement precisionVSLoss of time

Solution Approach 1:

The duty correction operation is divided into two distinct phases: initial duty correction using binary search method for rapid locking, and fine duty correction using linear search method for precise adjustment. This segmentation allows each phase to use the most appropriate algorithm for its specific requirements, resolving the contradiction between speed and precision.

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

The invention dynamically switches between binary search and linear search methods based on the current duty error magnitude. When duty error exceeds a threshold, binary search is used for fast correction; when duty error is within the threshold, linear search takes over for fine-tuning. This dynamic adaptation optimizes both locking time and precision throughout the correction process.

Inventive Principle:

Principle #15Dynamics

3Adaptability or versatility

If both binary search method and linear search method are implemented in a single circuit, then both advantages can be utilized, but device complexity increases

Engineering Contradiction:

Improvecorrection method flexibilityVSAvoidcircuit complexity

Core Design Contradiction:

Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The invention uses a single counting circuit that can perform both binary search and linear search operations by dynamically controlling the counting clock toggling. The same hardware infrastructure supports both correction methods, eliminating the need for separate circuits and reducing overall device complexity while maintaining versatility.

Inventive Principle:

Principle #6Universality (Multi-functionality)

Solution Approach 2:

The invention dynamically switches between binary search and linear search methods based on the current duty error magnitude. When duty error exceeds a threshold, binary search is used for fast correction; when duty error is within the threshold, linear search takes over for fine-tuning. This dynamic adaptation optimizes both locking time and precision throughout the correction process.

Inventive Principle:

Principle #15Dynamics

Data Source

PatentUS8866526B2Counting circuit of semiconductor device and duty correction circuit of semiconductor device using the same

Publication Date: 2014.10.21 MIMIRIP LLC

AI summary

A counting circuit of a semiconductor device includes a plurality of counting units configured to count respective bits of counting codes in response to a plurality of counting clocks, respectively, and to control in a counting direction in response to a counting control signal; a clock toggling control unit configured to control the number of counting clocks that toggle among the plurality of counting clocks in response to clock control signals; and a counting operation control unit configured to compare a value of target codes and a value of the counting codes, and to determine a value of the counting control signal according to a comparison result.