DUV LED Trench Layout for ESD Protection Without Light Absorption

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Solution Overview

Problem

Conventional deep ultraviolet (DUV) LED devices suffer from uneven light distribution, low luminous intensity, and poor electrostatic resistance due to excessive light absorption by anti-electrostatic discharge elements, which leads to malfunction under heat and UV radiation.

Innovation Solution

The LED device incorporates a substrate with an electrically conductive layer featuring a trench structure and an anti-electrostatic discharge element positioned to minimize light and heat absorption, with the LED chip and anti-electrostatic discharge element arranged to reduce overlap and absorption, enhancing light extraction efficiency and preventing malfunction.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If the anti-electrostatic discharge element is placed in the conventional LED device, then electrostatic protection is provided, but light absorption increases causing malfunction under heat and UV radiation

Engineering Contradiction:
Improveelectrostatic protectionVSAvoidlight absorption
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

The anti-electrostatic discharge element is extracted from the light path area and repositioned to a location where it does not absorb light from the LED chip. This separation removes the harmful interaction between the protective element and the light emission, allowing electrostatic protection to function without causing malfunction from light absorption.

Inventive Principle:
Principle #2Taking out (Extraction)

2Area of stationary object

If the DUV flip chip size is reduced, then device integration is improved, but the ratio of light emitted from side surfaces increases causing uneven light distribution

Engineering Contradiction:
Improvechip sizeVSAvoidlight distribution uniformity
Core Design Contradiction:
Area of stationary objectVSIllumination intensity

Solution Approach 1:

The patent applies local quality by positioning the anti-electrostatic discharge element in a specific location away from the light emission path. This localized placement ensures that the protective element does not interfere with the light distribution pattern, maintaining uniform illumination while providing electrostatic protection.

Inventive Principle:
Principle #3Local quality

3Object-affected harmful factors

If the anti-electrostatic discharge element is embedded into the substrate, then light absorption is reduced, but heat dissipation becomes unfavorable causing acceleration of malfunction

Engineering Contradiction:
Improvelight absorptionVSAvoidheat dissipation
Core Design Contradiction:
Object-affected harmful factorsVSTemperature

Solution Approach 1:

The patent introduces an intermediary positioning strategy where the anti-electrostatic discharge element is placed in a location that balances both light absorption and heat dissipation considerations. By positioning it away from the direct light path but with adequate thermal pathways, the element provides protection without suffering from excessive heat accumulation that would accelerate malfunction.

Inventive Principle:
Principle #24Intermediary (Mediator)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration improves light distribution and extraction efficiency while preventing the malfunction of anti-electrostatic discharge elements, resulting in a more reliable and efficient DUV LED device.

Implementation Method 1

A light-emitting diode (LED) device is a solid-state lighting device made of semiconductor materials

Methodology Applied
Scientific EffectLight emission from LED chip: Light Emitting Diode

Implementation Method 2

emits light from a backside of the DUV LED device to reduce light absorption of P-type gallium nitride-based materials

Methodology Applied
Scientific EffectLight absorption reduction: Absorption (EM radiation)

Implementation Method 3

the anti-electrostatic discharge element is prone to malfunction and damage when exposed to heat and UV radiation from the DUV LED chip

Methodology Applied
Scientific EffectLight absorption: Absorption (EM radiation)

Implementation Method 4

a major portion of electrical energy is transformed into thermal energy

Methodology Applied
Scientific EffectEnergy transformation: Joule Heating

Implementation Method 5

an anti-electrostatic discharge element is usually placed therein

Methodology Applied
Scientific EffectElectrostatic discharge protection: Electrostatic Discharge

Data Source

PatentUS12002796B2Light-emitting diode device
Publication Date: 2024.06.04 QUANZHOU SANAN SEMICON TECH CO LTD
  • US12002796B2 patent drawing
  • US12002796B2 patent drawing
  • US12002796B2 patent drawing

AI summary

An LED device includes a substrate, a conductive layer, an LED chip, and a discharge element. The substrate has upper and lower surfaces and four edges interconnected to one another and surrounding the upper surface. The conductive layer is formed on the upper surface, and has first and second regions electrically separated by a trench. The trench has a first segment inclined relative to each edge of the substrate by a predetermined angle ranging between 0 and 90 degrees, and a second segment connected to the first segment. The LED chip is disposed across the first segment, and the discharge element is disposed across the second segment, both interconnecting the first and second regions.