Dynamic Burn-In Board Control for DUT-Specific Test Parameters
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Solution Overview
Problem
Conventional burn-in test architectures fail to tailor burn-in parameters to the specific specifications or status of individual devices under test (DUTs), leading to inefficiencies and potential misidentification of defective chips.
Innovation Solution
A dynamic burn-in test system and method that includes a burn-in board, signal generation module, and dynamic adjustment module, which dynamically adjust test parameters based on the simulation test results of each DUT, allowing for customized testing through temperature and power control modules.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If a same burn-in parameter is used for different DUTs on a same burn-in board, then test efficiency is improved, but test precision and adaptability to specific DUTs deteriorate
Solution Approach 1:
The patent segments the burn-in test system by dividing DUTs into different groups based on their specifications and status. Each group is assigned dedicated test bases on the burn-in board, allowing different burn-in parameters to be applied to different groups simultaneously. This segmentation enables both high test efficiency (through parallel testing) and high test precision (through customized parameters for each group).
Solution Approach 2:
The patent implements dynamic adjustment of burn-in parameters based on the specific characteristics of each DUT group. The system dynamically configures test parameters such as temperature, voltage, and current according to the specifications and status of different DUT groups, rather than using fixed uniform parameters. This dynamic approach maintains adaptability while preserving test efficiency through parallel processing.
2Device complexity
If a same burn-in parameter is used for different DUTs on a same burn-in board, then device complexity is reduced, but adaptability to specific DUTs deteriorates
Solution Approach 1:
The patent designs the burn-in board with multi-functional test bases that can be dynamically configured for different DUT types. The same physical hardware infrastructure serves multiple functions by adapting test parameters and configurations based on the specific DUT group being tested. This universality allows the system to maintain low complexity while achieving high adaptability through software-controlled parameter adjustment.
Solution Approach 2:
The patent achieves adaptability to specific DUTs by changing test parameters (temperature, voltage, current, test patterns) based on the specifications and status of different DUT groups. Rather than requiring different hardware for each DUT type, the system modifies operational parameters dynamically, maintaining simple hardware architecture while achieving high versatility.
3Measurement precision
If dynamic adjustment of test parameters is implemented for each DUT, then test precision and adaptability are improved, but system complexity increases
Solution Approach 1:
The patent reduces system complexity by segmenting DUTs into groups with similar characteristics, rather than implementing fully individualized testing for each DUT. Each group is assigned dedicated test bases with customized parameters, achieving high test precision through group-specific optimization while avoiding the excessive complexity of completely independent control for every single DUT.
Solution Approach 2:
The patent merges the control of multiple DUTs with similar characteristics into a single test base configuration. By combining DUTs that share similar specifications and status into groups tested under the same parameters, the system achieves high precision for each group while reducing overall system complexity through consolidated control mechanisms.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables precise and efficient identification of unqualified DUTs by dynamically adjusting test parameters, improving the accuracy and efficiency of the burn-in process.
Implementation Method 1
The temperature control module is electrically connected to the substrate, and is configured to adjust a temperature of each test base under control of the dynamic adjustment module
Implementation Method 2
The power control module is electrically connected to the substrate, and is configured to adjust a voltage value outputted to each test base under control of the dynamic adjustment module
Data Source
AI summary
A dynamic burn-in test system includes at least one burn-in board, at least one signal generation module, and a dynamic adjustment module. The burn-in board is adapted for electrically connecting to a plurality of devices under test (DUTs). The signal generation module is configured to: control the DUTs to perform a test, determine at least one unqualified DUT of the DUTs in response to test results of the DUTs, transmit simulation test data to the unqualified DUT, control the unqualified DUT to execute the simulation test data to generate a simulation test result, and generate a dynamic test parameter in response to the simulation test result. The dynamic adjustment module is configured to: receive the dynamic test parameter 10 from the signal generation module, and modulate the burn-in board together with the signal generation module to perform a dynamic burn-in test on the unqualified DUT based on the dynamic test parameter.