Dynamic Contact Roller Force Control for Electronic Component Testing
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Miniature electronic components with diminished metal termination resilience require a reduced contact load to prevent damage during testing, while existing methods either risk damage with excessive force or decrease productivity by retracting the contact roller, leading to inefficiencies in testing systems.
Innovation Solution
A method and device that apply a first predetermined force during component transfer and a second, higher force when stationary for testing, using actuators like solenoids, fluid operators, or piezoelectric elements to vary contact force dynamically, ensuring stable testing without vertical movement of the contact roller.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the contact roller is preloaded to a constant force of 50 grams, then stable testing is achieved, but damage occurs to small electronic components during motion
Solution Approach 1:
The contact roller's applied force is made dynamic rather than static. The system transitions from a constant 50 gram preload to a variable force that adapts to the operational state: using a lower first predetermined force during transport and a higher second predetermined force during stationary testing. This dynamic adjustment resolves the contradiction by applying sufficient force for stable testing only when the component is stationary, preventing damage during motion.
Solution Approach 2:
The force parameter of the contact roller is changed based on operational conditions. The system switches between two distinct force levels (first predetermined force during transport, second predetermined force during testing) based on whether the test plate is moving or stationary. This parameter change allows the system to maintain testing stability when needed while minimizing harmful forces during transport.
2Object-affected harmful factors
If the contact roller is retracted during motion, then component damage is prevented, but productivity decreases by 5-13%
Solution Approach 1:
Instead of retracting the contact roller during motion (which would be a discrete state change), the system uses dynamic force adjustment where the roller maintains continuous contact but varies the applied force. This eliminates the need for retraction movements, thereby maintaining productivity while preventing component damage through intelligent force control.
Solution Approach 2:
The system replaces the mechanical retraction mechanism (solenoid coil that raises and lowers the roller) with a force control mechanism that adjusts contact pressure dynamically. This substitution eliminates the vertical movement of the roller during transport, maintaining continuous testing readiness and improving productivity while still protecting components.
3Force
If additional force is placed on moving electronic components, then contact force is increased for stable measurement, but component damage occurs
Solution Approach 1:
The contact force parameter is changed based on the operational state of the test plate. During motion, the system applies a first predetermined force (lower) that is sufficient for measurement but not excessive. During stationary testing, the system transitions to a second predetermined force (higher) that ensures stable measurement. This parameter change resolves the contradiction by matching the force level to the operational requirements.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach allows for reliable testing of small electronic components with minimal damage and maintains productivity by applying the necessary force only when required, reducing the 5-13% productivity loss associated with traditional methods.
Implementation Method 1
The contact roller is actuated by a solenoid coil. When the solenoid coil is de-energized, the contact roller is in a raised position above the test plate. Once the test plate stops and an electronic component is in place at the test station for testing, the solenoid coil energizes and lowers the contact roller.
Implementation Method 2
The spring support may vary in length and include springs that continually bias or urge the supports to the maximum lengths. Presently, the contact roller is preloaded to a constant force.
Data Source
AI summary
A device for testing small electronic components includes a test plate for moving a plurality of spaced electronic components to a test station. A roller is designed to press on the test plate and electronic component exerting a first force between 10-20 grams when the test plate and electronic component are moving and exerting a second force of about 50 grams when the test plate is stopped and the electronic component is aligned in the test station. The forces exerted on the test plate and electronic component are controlled by a force-application actuator, such as fluid operated actuator, for example a pneumatic actuator or a solenoid.