Dynamic Die Block Mapping for Memory Channel Optimization
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Solution Overview
Problem
Traditional memory systems face performance degradation and channel collision issues due to static die mapping, which is not upgradable and cannot adapt to die block failures, leading to data degradation and reduced longevity.
Innovation Solution
Implementing a dynamic die block mapping system that generates new mappings on-the-fly to optimize die block operations, avoiding channel collisions and ensuring consistent data operations by using a mapping matrix component to identify and reassign valid die blocks.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If static die mapping is used, then device complexity is reduced, but reliability deteriorates due to inability to adapt to die block failures
Solution Approach 1:
The patent implements dynamic die block mapping that automatically generates new mappings when die block failures are detected. The mapping is no longer static but adapts in real-time based on the health status of die blocks, resolving the contradiction by making the system flexible and responsive to failures while maintaining manageable complexity through automated processes.
Solution Approach 2:
The system incorporates feedback mechanisms that monitor die block status and trigger remapping operations when failures occur. This closed-loop approach ensures the mapping adapts to actual device conditions, improving reliability without requiring complex manual intervention by maintaining automated detection and response protocols.
2Productivity
If static die mapping is used, then ease of operation is improved, but productivity deteriorates due to performance degradation from channel collisions
Solution Approach 1:
The dynamic mapping system adjusts die block assignments based on operational needs and failure conditions, preventing channel collisions that degrade performance. This resolves the contradiction by maintaining high productivity through adaptive resource allocation while keeping ease of operation intact via automated management that eliminates manual mapping adjustments.
Solution Approach 2:
The system changes mapping parameters dynamically based on detected failures and performance requirements. By adjusting the mapping configuration in response to actual device state, the system maintains optimal performance without requiring complex manual parameter tuning, thus resolving the contradiction between productivity and ease of operation.
3Loss of information
If static die mapping is used, then device complexity is reduced, but loss of information deteriorates due to data degradation from channel collisions
Solution Approach 1:
The dynamic remapping capability prevents data degradation by redistributing data from failed die blocks to healthy ones, eliminating channel collision issues that cause information loss. This resolves the contradiction by protecting data integrity through adaptive mapping while maintaining reasonable system complexity via automated management protocols.
Solution Approach 2:
The feedback-driven remapping system continuously monitors for conditions that could lead to data degradation and proactively reassigns data to prevent loss. This resolves the contradiction between minimizing information loss and managing device complexity by using automated feedback loops that prevent degradation before it occurs rather than requiring complex preventive measures.
Data Source
AI summary
A memory device includes a plurality of memory die blocks and a plurality of memory channels operably coupled to the plurality of memory die blocks and a memory controller configured to identify one or more memory die blocks as being invalid. The memory controller obtains a first matrix storing a mapping of memory channels to memory die blocks and creates a new mapping of memory channels to memory die blocks excluding the invalid memory die blocks. The new mapping is stored in a second matrix and one or more operations are performed on the memory die blocks based on the new mapping.