Dynamic D Flip-Flop Data Retention Circuit for Leakage Control

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Solution Overview

Problem

Existing dynamic flip-flops face challenges in maintaining data retention time due to increased operation frequency, leading to dynamic leakage current and potential data loss.

Innovation Solution

A dynamic D flip-flop design is introduced, featuring a data retention unit comprising PMOS and NMOS transistors connected in parallel, which assists in storing data at nodes within the flip-flop, thereby extending data retention time.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If operation frequency is increased to improve processing speed, then productivity is improved, but data retention time deteriorates due to dynamic leakage current

Engineering Contradiction:
Improveoperation frequencyVSAvoiddata retention time
Core Design Contradiction:
ProductivityVSDuration of action of moving object

Solution Approach 1:

The flip-flop is divided into multiple latch units (first latch unit, second latch unit, third latch unit) that operate in a pipeline manner. Each latch unit captures and holds data at different clock phases, allowing the overall system to maintain data retention while operating at higher frequencies. The segmentation of the single latch into multiple sequential latches distributes the data holding function across time phases.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The first latch unit performs preliminary data capture and holding before the second latch unit processes the data. By pre-capturing data in the first latch unit during the first clock phase, the system ensures data is already stored and stable before subsequent processing occurs, preventing data loss even at high operation frequencies.

Inventive Principle:
Principle #10Preliminary action

2Device complexity

If data is temporarily stored in parasitic capacitance to simplify structure, then device complexity is reduced, but data retention time deteriorates due to dynamic leakage current

Engineering Contradiction:
Improvestructure simplicityVSAvoiddata retention time
Core Design Contradiction:
Device complexityVSDuration of action of moving object

Solution Approach 1:

Multiple latch units are merged into a single integrated flip-flop structure with shared clock signal terminals and coordinated operation. The first, second, and third latch units work together as a unified data retention system, combining their individual data holding capabilities to achieve extended overall data retention time while maintaining a relatively compact structure.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The latch units operate in periodic cycles synchronized by clock signals. The first latch unit captures data during the first clock phase, the second latch unit processes it during the second clock phase, and the third latch unit outputs during the third clock phase. This periodic operation allows each latch to be refreshed regularly, preventing data loss from leakage while maintaining structural simplicity.

Inventive Principle:
Principle #19Periodic action

Data Source

PatentUS20250158600A1Dynamic d flip-flop, data operation unit, chip, hash board and computing device
Publication Date: 2025.05.15 CANAAN CREATIVE (SH) CO LTD
  • US20250158600A1 patent drawing
  • US20250158600A1 patent drawing
  • US20250158600A1 patent drawing

AI summary

The invention provides a dynamic D flip-flop (100), comprising: an input terminal (D), an output terminal (Q), a clock signal terminal (CLK1, CLK2), a first latch unit (101), a second latch unit (102), an output drive unit (103); the first latch unit (101), the second latch unit (102), and the output drive unit (103) are sequentially connected in series between the input terminal (D) and the output terminal (Q); a first node (S0) is provided between the first latch unit (101) and the second latch unit (102), and a second node (S1) is provided between the second latch unit (102) and the output drive unit (103); wherein, further comprising a data retention unit (104) electrically connected to the first node (S0) and/or the second node (S1). The data retention time can be effectively increased and the security and accuracy of data can be improved.