Dynamic Gate Resistance Control for Power Transistor Surge Suppression

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Solution Overview

Problem

High-speed switching of power transistors generates surge voltages, leading to potential breakdown of gate insulating films and electromagnetic noise, while increasing gate resistance to suppress these issues decreases switching speed and increases switching loss.

Innovation Solution

A semiconductor device with a surge voltage measuring unit, variable resistor, comparator, determination unit, and instruction unit dynamically adjusts the gate resistance to control surge voltages, using feedback from measured surge voltages to set optimal resistance values, thereby minimizing switching loss and noise.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Object-affected harmful factors

If the resistance of the gate connected to the gate electrode is increased to suppress surge voltage, then the surge voltage is reduced, but the switching speed decreases and switching loss increases

Engineering Contradiction:
Improvesurge voltageVSAvoidswitching loss
Core Design Contradiction:
Object-affected harmful factorsVSLoss of energy

Solution Approach 1:

The patent applies a variable resistor instead of a fixed resistor to dynamically adjust the gate resistance. The resistance value changes based on operating conditions, allowing the system to maintain low resistance for high-speed switching when needed while increasing resistance to suppress surge voltage when necessary, thus resolving the contradiction between surge suppression and switching loss

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent changes the resistance parameter of the gate resistor from a fixed value to a variable value that can be adjusted based on operating conditions. By controlling the resistance value to be larger or smaller depending on the situation, the system optimizes both surge voltage suppression and switching speed, preventing unnecessary energy loss

Inventive Principle:
Principle #35Parameter changes

2Object-affected harmful factors

If the resistance of the gate connected to the gate electrode is increased to suppress surge voltage, then the surge voltage is reduced, but the switching speed decreases

Engineering Contradiction:
Improvesurge voltageVSAvoidswitching speed
Core Design Contradiction:
Object-affected harmful factorsVSSpeed

Solution Approach 1:

The variable resistor enables dynamic adjustment of gate resistance based on real-time operating conditions. The control unit adjusts the resistance to be smaller during high-speed switching operations and larger during surge suppression scenarios, allowing the system to maintain high switching speed when needed while suppressing surge voltage when necessary

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent changes the resistance parameter from fixed to variable, allowing optimization of both switching speed and surge suppression. By adjusting the resistance value according to operating conditions, the system achieves high switching speed when low resistance is applied and effective surge suppression when high resistance is applied, eliminating the need to compromise switching speed

Inventive Principle:
Principle #35Parameter changes

3Object-affected harmful factors

If a fixed high resistance is used to suppress surge voltage, then the surge voltage is suppressed, but the circuit design becomes less optimal and switching performance deteriorates

Engineering Contradiction:
Improvesurge voltageVSAvoidcircuit design flexibility
Core Design Contradiction:
Object-affected harmful factorsVSEase of manufacture

Solution Approach 1:

The patent replaces fixed resistors with variable resistors that can be dynamically controlled based on operating conditions. This dynamic approach allows the circuit design to adapt to different scenarios, optimizing both surge suppression and switching performance without being constrained by fixed resistance values, thereby improving overall circuit design flexibility

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

By changing the resistance parameter from fixed to variable, the patent enables more flexible circuit design. The control unit can adjust the resistance value to match optimal settings for different operating conditions, avoiding the need for conservative fixed resistance values that compromise performance, thus improving circuit design quality and adaptability

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach allows for precise control of gate resistance to suppress surge voltages and electromagnetic noise without unnecessarily decreasing switching speed, reducing switching loss and simplifying circuit design processes.

Implementation Method 1

a surge voltage measuring unit configured to measure a surge voltage generated when the power transistor switches

Methodology Applied
Scientific EffectVoltage measurement: Electric Field

Implementation Method 2

a variable resistor configured to be electrically connected to the gate electrode... determining a setting value of a resistance value of the variable resistor

Methodology Applied
Scientific EffectElectrical resistance: Electrical Resistance

Data Source

PatentUS10958156B2Electronic circuit, power conversion device, driving device, vehicle, and elevator
Publication Date: 2021.03.23 KK TOSHIBA
  • US10958156B2 patent drawing
  • US10958156B2 patent drawing
  • US10958156B2 patent drawing

AI summary

Provided is a semiconductor device including: a semiconductor element including a first electrode, a second electrode, and a gate electrode; a surge voltage measuring unit electrically connected to the first electrode or the second electrode and configured to measure a surge voltage; a variable resistor electrically connected to the gate electrode; a comparator configured to compare a surge voltage measurement value, which is acquired by measuring the surge voltage generated by a first pulse applied to the gate electrode by the surge voltage measuring unit, with a surge voltage target value; a determination unit configured to determine a setting value of a resistance value of the variable resistor based on the comparison result by the comparator; and an instruction unit configured to instruct the setting value to the variable resistor.