Dynamic Intelligent Test System for Minimum Power Consumption

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Solution Overview

Problem

Current testing methods for determining minimum power consumption values in product design are time-consuming, significantly impacting test capacity and efficiency.

Innovation Solution

A dynamic intelligent test system utilizing a data distribution model with AI convolution deep learning to predict test ranges, reducing the scope of testing and employing algorithms like binary search to quickly identify minimum power consumption values, which are then updated dynamically based on new test data.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If comprehensive testing is performed across all frequency and voltage ranges to ensure accurate minimum power consumption values, then measurement precision is improved, but testing time increases significantly

Engineering Contradiction:
Improveminimum power consumption value accuracyVSAvoidtesting time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The system performs preliminary actions by establishing a data distribution model before actual testing begins. Historical test data is used to pre-determine test ranges and identify critical areas, allowing the testing process to focus only on relevant parameters rather than exhaustively testing all possibilities.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

A data distribution model acts as an intermediary between historical test data and current testing requirements. This model processes and analyzes historical data to generate optimized test ranges, serving as a bridge that reduces the search space for minimum power consumption values without sacrificing accuracy.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Reliability

If testing is performed across wide frequency and voltage ranges to ensure comprehensive coverage, then reliability is improved, but productivity decreases

Engineering Contradiction:
Improvetest coverage completenessVSAvoidtest capacity
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The system dynamically adjusts test parameters (frequency and voltage ranges) based on the data distribution model. Instead of using fixed wide ranges, the system adapts the test parameters to match the actual distribution characteristics of the device under test, achieving both comprehensive coverage and efficient testing.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The testing system becomes dynamic by continuously updating the data distribution model with new test results. This allows the test ranges to evolve and adapt over time, improving reliability through better data accumulation while reducing testing time through learned optimizations.

Inventive Principle:
Principle #15Dynamics

3Productivity

If multiple test projects are added to the testing station to increase test capacity, then productivity is improved, but device complexity increases

Engineering Contradiction:
Improvetest capacityVSAvoidtesting station complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The data distribution model serves multiple functions: it analyzes historical data, determines test ranges, identifies critical parameters, and optimizes test sequences. This multi-functional approach allows a single testing station to handle multiple test projects efficiently without requiring separate specialized equipment for each test type.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The system implements feedback mechanisms where test results are fed back into the data distribution model for continuous refinement. This feedback loop allows the system to learn from previous tests and automatically optimize future testing, reducing the need for manual configuration and decreasing operational complexity.

Inventive Principle:
Principle #23Feedback

Data Source

PatentUS11556818B2Dynamic intelligent test method and computer device employing the method
Publication Date: 2023.01.17 HONGFUJIN PRECISION ELECTRONICS (ZHENGZHOU) CO LTD
  • US11556818B2 patent drawing
  • US11556818B2 patent drawing
  • US11556818B2 patent drawing

AI summary

A method for dynamic intelligent testing of a target, to be tested according to projects, includes calling up a data distribution model of a project in response to a target being tested by the project, and obtaining a test range corresponding to the project based on the data distribution model. The method further includes obtaining a test value when the target is at a minimum power consumption value by testing the target based on the test range, and updating the data distribution model and the test range of the project based on the test value.