Dynamic Measurement Ratio Allocation for Sampling Efficiency
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Solution Overview
Problem
Current measurement methods for product quality assessment are inefficient in terms of cost and time, particularly due to the need for total inspections which are not feasible, leading to the use of sampling inspections that may incorrectly determine defective products as appropriate, resulting in type II errors and increased processing costs.
Innovation Solution
A measurement method and system that calculates and allocates measurement capability based on processing devices and conditions, determining a measurement ratio to optimize sampling efficiency by considering error ratios, processing scheduled quantities, and measurement times, allowing for the skipping of measurements when workload exceeds critical values and risk indices are within thresholds.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If total inspection is performed to ensure quality, then measurement precision is improved, but productivity deteriorates due to excessive time and cost requirements
Solution Approach 1:
The patent applies partial action by performing measurement on only a subset of lots (sampling inspection) rather than all lots (total inspection). The measurement capability is allocated to determine an optimal measurement ratio, where only necessary measurements are performed based on processing conditions and error ratios, thus improving productivity while maintaining acceptable quality assessment accuracy.
2Productivity
If sampling inspection is used to improve productivity, then process efficiency is improved, but measurement precision deteriorates due to type II errors in quality assessment
Solution Approach 1:
The patent changes the parameter of measurement ratio dynamically based on processing conditions, error ratios, and measurement capability allocation. By adjusting the measurement ratio according to these parameters, the system optimizes the balance between productivity and measurement precision, reducing type II errors while maintaining high process efficiency.
Solution Approach 2:
The patent incorporates feedback mechanisms where measurement results and error ratios are used to adjust future measurement decisions. The system learns from past measurement outcomes and processing conditions to optimize the measurement ratio, thereby improving quality assessment accuracy over time while maintaining productivity.
3Measurement precision
If measurement capability is increased to reduce type II errors, then measurement precision is improved, but loss of energy increases due to more frequent measurements
Solution Approach 1:
The patent applies partial action by performing measurement only when necessary, determined by the allocated measurement capability and calculation of measurement ratio. This avoids excessive measurements and reduces energy loss while maintaining quality assessment accuracy through targeted sampling inspection based on processing conditions and error ratios.
Data Source
AI summary
Example embodiments relate to a measurement method of measuring lots with improved process efficiency. The measurement method may include calculating a measurement capability (indicating a degree to which members to be measured may be processed per unit time in a measurement device); allocating the measurement capability according to a processing device and a processing condition; and calculating a measurement ratio of the lots processed by the processing device and the processing condition.