Dynamic Memory Refresh Based on Temperature Decay
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Solution Overview
Problem
Non-volatile memory in devices degrades rapidly at elevated temperatures, leading to unreliable data storage, especially in applications requiring a wide range of operating temperatures, and existing solutions either require expensive high-temperature memory or frequent energy-consuming refreshes.
Innovation Solution
A data processing device that periodically estimates the current rate of memory decay based on ambient temperature and refreshes the memory when the accumulated decay exceeds a predetermined threshold, using a processor and temperature sensor to manage memory refreshes efficiently.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If specialized high-temperature memory is used, then reliability at elevated temperatures is improved, but cost and energy consumption increase
Solution Approach 1:
The patent changes the parameter of memory refresh timing from fixed periodic intervals to dynamic intervals based on accumulated decay estimation. The processor estimates memory decay rate based on temperature and updates an accumulated decay counter, triggering refresh only when the threshold is exceeded. This adaptive parameter adjustment reduces unnecessary refresh operations at lower temperatures while ensuring reliability at elevated temperatures.
2Reliability
If frequent memory refreshes are performed, then data reliability is maintained, but energy consumption increases
Solution Approach 1:
The patent implements a feedback mechanism where the processor periodically estimates the current rate of memory decay based on temperature sensing, updates an accumulated decay level, and uses this feedback to determine when refresh is necessary. This closed-loop control ensures refresh operations are performed based on actual decay conditions rather than fixed schedules, minimizing energy waste while maintaining data integrity.
Solution Approach 2:
The patent makes the memory refresh operation dynamic by adjusting refresh timing based on real-time temperature conditions and estimated decay rates. Instead of static periodic refresh, the system adapts refresh frequency to match actual memory decay characteristics, performing refresh only when accumulated decay exceeds the threshold, thereby optimizing energy efficiency.
3Measurement precision
If memory decay is monitored continuously, then refresh timing accuracy is improved, but processing overhead and energy consumption increase
Solution Approach 1:
The patent employs periodic action by having the processor estimate memory decay rate at periodic intervals rather than continuously. The processor periodically senses temperature, estimates decay based on the temperature and elapsed time, and updates the accumulated decay counter. This periodic monitoring approach achieves sufficient measurement precision for determining refresh timing while minimizing processing overhead and energy consumption compared to continuous monitoring.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach extends the memory's lifespan in low-power devices, reducing energy consumption and costs by avoiding the need for specialized high-temperature memory and minimizing unnecessary refreshes, while maintaining reliability across varying temperatures.
Implementation Method 1
The processor may be configured to form the estimate of a current rate of decay of the memory in dependence on a sensed ambient temperature
Data Source
AI summary
A data processing device including a processor and a memory interface, the processor being configured to control the refreshing of a memory by the steps of: periodically forming an estimate of a current rate of decay of a memory and updating an accumulated level of decay of the memory in dependence on the estimated current rate of decay; and causing the memory interface to refresh the memory when the accumulated level of decay exceeds a predetermined threshold. The estimate may be based on a measurement of ambient temperature.