Dynamic Photocathode Electron Beam Lithography

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Solution Overview

Problem

Existing electron beam lithography technologies are complex, costly, and suffer from long electron beam paths that degrade the beam, leading to inefficiencies and high maintenance needs, particularly in scanning-type lithography systems.

Innovation Solution

A photonically generated electron beam with a desired pattern is directed directly onto a target substrate using a dynamic pattern generator with addressable photoemissive elements, eliminating the need for electron prisms and reducing beam path length, resulting in a simpler, more efficient, and cost-effective process.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If scanning-type electron beam lithography is used, then high resolution can be achieved, but the process becomes very time-consuming

Engineering Contradiction:
ImproveresolutionVSAvoidprocessing speed
Core Design Contradiction:
Manufacturing precisionVSProductivity

Solution Approach 1:

The patent replaces the mechanical scanning system with a direct-write system that uses a dynamically controlled photocathode to generate patterned electron beams. Instead of sequentially scanning a focused beam across the substrate, the system directly projects patterns onto the substrate, eliminating the time-consuming scanning process while maintaining high resolution through precise electron optical control.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent uses a photocathode that is pre-programmed with the desired pattern through selective activation of photoemissive elements. The pattern information is prepared in advance in the photocathode structure itself, allowing direct pattern transfer without real-time scanning decisions, thereby increasing processing speed while preserving resolution.

Inventive Principle:
Principle #10Preliminary action

2Ease of operation

If electron prisms and long beam paths are used, then beam direction control is achieved, but beam degradation occurs

Engineering Contradiction:
Improvebeam direction controlVSAvoidbeam quality
Core Design Contradiction:
Ease of operationVSReliability

Solution Approach 1:

The patent extracts and eliminates the electron prism component from the beam path. By using a dynamically controlled photocathode that directly emits patterned electrons, the system removes the need for electron prisms to deflect and redirect the beam, thereby shortening the beam path and preventing the degradation that occurs over long trajectories.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent creates a direct optical copy of the desired pattern from the photocathode to the substrate through electron optical projection. This copying mechanism eliminates the need for intermediate beam manipulation components like prisms, allowing the pattern to be transferred directly while maintaining beam quality and reducing path length.

Inventive Principle:
Principle #26Copying

3Use of energy by moving object

If traditional lithographic processes are used, then electromagnetic energy is available for exposure, but the equipment becomes complex and costly

Engineering Contradiction:
Improveexposure energyVSAvoidsystem complexity
Core Design Contradiction:
Use of energy by moving objectVSDevice complexity

Solution Approach 1:

The patent changes the fundamental parameter of energy form from electromagnetic (photons) to particle (electrons) at the source level. By using a photocathode that converts light to electrons and directly projecting these electrons onto the substrate, the system eliminates the need for complex electromagnetic exposure equipment while maintaining effective energy delivery for resist exposure.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The dynamically controlled photocathode serves multiple functions: it acts as the electron source, the pattern generator, and the beam modulator all in one component. This multi-functionality eliminates the need for separate systems for each function, thereby reducing overall system complexity and cost while maintaining effective exposure capability.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables high-resolution, high-throughput pattern transfer onto larger areas of the substrate with reduced electron-electron interactions and lower maintenance costs, improving upon the limitations of traditional scanning e-beam systems.

Implementation Method 1

A photonically generated electron beam with a desired pattern is directed directly onto a target substrate using a dynamic pattern generator with addressable photoemissive elements

Methodology Applied
Scientific EffectPhotoelectric effect: Photoelectric Effect

Implementation Method 2

The patterned electron beam enables the transfer of a selected pattern to a surface of a target substrate

Methodology Applied
Scientific EffectElectron beam: Electron Beam

Data Source

PatentUS7696498B2Electron beam lithography method and apparatus using a dynamically controlled photocathode
Publication Date: 2010.04.13 KLA TENCOR TECHNOLOGY CORP
  • US7696498B2 patent drawing
  • US7696498B2 patent drawing
  • US7696498B2 patent drawing

AI summary

Embodiments of the invention include an electron beam lithography device using a dynamically controllable photocathode capable of producing a patterned electron beam. One such implementation includes a dynamic pattern generator configurable to produce an electron beam having a desired image pattern impressed thereon. Such an electron beam pattern being enabled by selectively activating programmable photoemissive elements of the pattern generator. The apparatus further including an illumination source arranged to direct a light beam onto the dynamic pattern generator to produce the electron beam having the desired pattern. The electron beam being directed through associated electron optics configured to receive the electron beam from the dynamic pattern generator and direct the electron beam onto a target substrate mounted on a stage.