Dynamic Pin Resource Allocation for Semiconductor Test Apparatus
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Solution Overview
Problem
Conventional test apparatuses face inefficiencies in assigning pin resources to semiconductor devices under test, leading to redundant resources and limited simultaneous testing capabilities due to predetermined division patterns that do not adapt to varying terminal configurations of different devices.
Innovation Solution
A test apparatus and method that include multiple test signal supply sections and terminal correspondence determination sections, allowing for flexible assignment of pin resources and re-testing of devices based on determination results, enabling efficient utilization of pin resources and adaptable testing across diverse semiconductor devices.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of manufacture
If predetermined division patterns are used to assign pin resources to devices under test, then the test apparatus can operate with simple resource allocation, but the pin resources cannot be efficiently utilized when testing devices with varying terminal configurations
Solution Approach 1:
The patent implements dynamic pin resource assignment where the test apparatus automatically determines the optimal division pattern based on the actual number of terminals in each device under test. Instead of using fixed predetermined patterns, the system dynamically adjusts the assignment of driver pin resources and IO common pin resources to match the specific terminal configuration of each device, thereby resolving the contradiction between operational simplicity and adaptability.
2Device complexity
If a fixed number of driver pin resources and IO common pin resources are assigned to each device, then the resource management is simplified, but redundant pin resources occur when testing devices with different terminal ratios
Solution Approach 1:
The patent changes the parameters of pin resource allocation by introducing a determination section that calculates the optimal number of driver pin resources and IO common pin resources based on the terminal count of each device. This parameter adjustment eliminates redundancy by ensuring that each device receives exactly the number of pin resources it needs, rather than allocating fixed amounts that may exceed requirements for devices with fewer terminals.
3Ease of operation
If the test apparatus uses predetermined division patterns for pin resources, then the testing process is straightforward, but the simultaneous testing capability is limited when devices have varying terminal configurations
Solution Approach 1:
The patent enables the test apparatus to dynamically determine division patterns for pin resources based on the terminal configurations of multiple devices being tested simultaneously. The determination section calculates optimal assignments that maximize the number of devices that can be tested in parallel, thereby improving productivity while maintaining ease of operation through automated resource allocation.
Data Source
AI summary
Provided is a test apparatus including: test signal supply sections supplying a test signal writing test data to the connected memory under test, to a terminal of the memory; terminal correspondence determination sections outputting a terminal unit determination result indicating whether test data from the connected terminal matches an expected value; a determination result selection section selecting, for each memory, terminal unit determination results from the terminal correspondence determination sections; a memory correspondence determination section determining whether writing succeeded to each memory, based on the selection result by the determination result selection section; an identifying section identifying a test signal supply section connected to the memory to which writing succeeded and a test signal supply section connected to the memory to which writing failed; and a mask treatment section instructing each test signal supply section whether to perform re-testing, according to whether writing succeeded.