Dynamic Stitch Density Control for Quilting Throughput

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Solution Overview

Problem

Traditional quilting machines sew patterns at a constant stitch density, which can lead to inefficiencies and reduced throughput due to the need for higher stitch density in intricate areas and lower stitch density in less detailed areas, resulting in compromised efficiency and cosmetic versatility.

Innovation Solution

A method to dynamically change stitch density during sewing based on real-time analysis of pattern elements, allowing for variable stitch densities to optimize yardage throughput while maintaining constant sewing speeds, by automatically adjusting stitch density for different elements within a pattern.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If a consistent high stitch density is used throughout the entire pattern, then sewing accuracy and detail quality are improved, but manufacturing efficiency and throughput are reduced

Engineering Contradiction:
Improvesewing accuracyVSAvoidthroughput
Core Design Contradiction:
Manufacturing precisionVSProductivity

Solution Approach 1:

The patent applies different stitch densities to different regions of the quilting pattern based on their specific requirements. Intricate pattern elements receive higher stitch densities for accuracy, while simpler areas use lower stitch densities for efficiency, optimizing both quality and productivity across the entire pattern.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The system dynamically adjusts stitch density during the sewing process based on real-time analysis of pattern elements. The quilting machine automatically transitions between different stitch densities as it moves through the pattern, allowing high precision where needed and high speed where appropriate, thereby resolving the contradiction between accuracy and throughput.

Inventive Principle:
Principle #15Dynamics

2Productivity

If a consistent low stitch density is used throughout the entire pattern, then manufacturing efficiency and throughput are improved, but sewing accuracy and detail quality are reduced

Engineering Contradiction:
ImprovethroughputVSAvoidsewing accuracy
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The patent applies different stitch densities to different regions of the quilting pattern based on their specific requirements. Intricate pattern elements receive higher stitch densities for accuracy, while simpler areas use lower stitch densities for efficiency, optimizing both quality and productivity across the entire pattern.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The system dynamically adjusts stitch density during the sewing process based on real-time analysis of pattern elements. The quilting machine automatically transitions between different stitch densities as it moves through the pattern, allowing high precision where needed and high speed where appropriate, thereby resolving the contradiction between accuracy and throughput.

Inventive Principle:
Principle #15Dynamics

3Productivity

If variable stitch densities are applied to different pattern elements, then yardage throughput is optimized, but system complexity increases

Engineering Contradiction:
Improveyardage throughputVSAvoidsystem complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The quilting system automatically analyzes the pattern elements and determines appropriate stitch densities without manual intervention. The machine self-adjusts stitch density based on pattern characteristics, reducing the need for complex manual control systems while still achieving optimized yardage throughput.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The system changes the stitch density parameter dynamically based on pattern element characteristics. By automatically adjusting this key parameter in response to pattern analysis, the system optimizes yardage throughput while managing complexity through automated parameter modification rather than complex mechanical adjustments.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentEP3122925B1Method of dynamically changing stitch density for optimal quilter throughput
Publication Date: 2019.05.15 L & P PROPERTY MANAGEMENT CO
  • EP3122925B1 patent drawingFigure 1~2
  • EP3122925B1 patent drawingFigure 3
  • EP3122925B1 patent drawingFigure 4

AI summary

A method of dynamically changing stitch density of a pattern during sewing is provided. Embodiments of the invention include dynamically changing stitch density along an axis of a sewing pattern based on identifying pattern elements, which may include line segments and arc segments. Each of the line and/or arc segments is assigned a dynamically adjusted stitch density based on analysis of each pattern element and/or adjacent element. An adjusted stitch density is assigned to portions of pattern elements that satisfy a threshold measurement for sewing with an adjusted stitch density. In embodiments, a standard stitch density, intermediate stitch density, or an altered stitch density is automatically assigned to each portion of a sewing pattern based on an analysis of threshold length of an element, a threshold angle of a portion of the element with respect to the axis, and/or the stitch density assigned to an adjacent element.