Dynamic Storage Area Allocation for Semiconductor Repair
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Solution Overview
Problem
Semiconductor apparatuses face challenges in performing repair operations for memory cells, particularly in distinguishing between internal and external failure information to prevent abnormal operations during repair, due to limitations in storage capacity management and comparison control mechanisms.
Innovation Solution
The apparatus includes a storage area signal generation circuit and an information storage circuit that adjust storage capacity for external failure information based on the set storage capacity for internal failure information, and a failure information comparison circuit that generates match signals to control repair operations, preventing repairs on identical internal and external failure information.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Quantity of substance
If the apparatus stores both internal failure information and external failure information in separate fixed storage areas, then the storage management is simple, but the storage capacity is wasted when the number of failures is small
Solution Approach 1:
The patent implements dynamic storage area allocation where the first storage area size is adjusted based on the actual number of internal failure information items. The storage area signal generation circuit dynamically generates selection signals to configure the failure information storage circuit's first storage area size, enabling the system to adapt storage capacity to actual needs rather than using fixed allocation, thus improving storage utilization without excessive complexity
Solution Approach 2:
The system changes the storage parameter (first storage area size) based on the number of failure information items. The operation control circuit determines the appropriate storage area size according to the actual failure data volume, and the storage area signal generation circuit translates this into configuration signals that adjust the physical storage allocation, allowing flexible adaptation to varying storage requirements
2Reliability
If the apparatus performs repair operations without comparing external failure information with stored failure information, then the repair process is fast, but abnormal operations may occur when repairing identical failures
Solution Approach 1:
The patent performs preliminary comparison between external failure information and stored failure information before executing the repair operation. The failure information comparison circuit conducts this comparison in advance during an external information reception mode, and based on the comparison result, determines whether to proceed with the repair or inhibit it, preventing abnormal operations on identical failures while maintaining efficient repair processing
Solution Approach 2:
The patent introduces a comparison mechanism as an intermediary step between receiving external failure information and executing repair operations. The failure information comparison circuit acts as a mediator that validates whether the external failure information matches existing stored information, and the operation control circuit uses this intermediate comparison result to control the subsequent repair operation, ensuring reliability without excessive time loss
3Quantity of substance
If the apparatus uses a fixed storage area for external failure information, then the storage structure is simple, but the storage capacity cannot be optimized based on actual usage
Solution Approach 1:
The patent implements dynamic storage area configuration where the first storage area size is not fixed but is determined by the actual number of internal failure information items. The storage area signal generation circuit dynamically generates selection signals based on operational mode and failure data volume to configure the failure information storage circuit's first storage area size, enabling efficient storage capacity utilization without requiring complex external storage management
Solution Approach 2:
The failure information storage circuit is designed to universally handle both internal failure information and external failure information storage. By using a single storage circuit with dynamically configurable first storage area size, the system eliminates the need for separate fixed storage areas for different failure information types, improving storage efficiency while maintaining relatively simple control through unified management
Data Source
AI summary
An apparatus includes a storage area signal generation circuit configured to generate a storage area signal when performing an internal information storage operation and an external information storage operation; and an information storage circuit configured to receive internal failure information, stored in the apparatus, based on the storage area signal and store the received internal failure information as failure information in a set storage capacity, and store external failure information, applied from outside the apparatus, as the failure information in a variable storage capacity.