Dynamic Test Control Assignment for Flexible Resource Utilization
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Solution Overview
Problem
Conventional test apparatuses often fail to utilize resources efficiently, as they assign test sections to site controllers without flexibility, leading to unused sections when testing devices with varying terminal counts, such as an 8-terminal DUT using a 12-section test module.
Innovation Solution
The test apparatus allows independent assignment of test control sections to test sections within a module, enabling flexible control and efficient resource utilization by using a control processor and communication interface to manage signal exchanges and control instructions between test control sections and modules.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If a conventional test apparatus assigns a test section controlled by each site controller for each test module, then the control structure is simple and fixed, but test sections may remain unused when testing devices with fewer terminals than available test sections
Solution Approach 1:
The patent implements dynamic assignment of test control sections to test sections through a test section assignment table stored in a storage unit. The system can flexibly reassign which test control section controls which test section based on the specific testing requirements and device configuration, transforming the static one-to-one mapping into a dynamic, configurable relationship that adapts to different testing scenarios
Solution Approach 2:
The patent enables one test control section to control multiple test sections through the assignment table mechanism. A single test control section can be assigned to control different test sections depending on the testing needs, making the test control section multi-functional and eliminating the waste of unused test sections
2Adaptability or versatility
If a test module includes more test sections than needed for a specific DUT, then future testing flexibility is improved, but resource waste occurs when testing devices with fewer terminals
Solution Approach 1:
The patent merges the control functions of multiple test sections into a single test control section when appropriate. Through the assignment table, multiple test sections can be controlled by one test control section, allowing the system to effectively combine resources and avoid leaving test sections unused during testing of devices with fewer terminals
Solution Approach 2:
The system dynamically adjusts the mapping between test control sections and test sections based on the specific device under test. The assignment table allows real-time reconfiguration so that when testing an 8-terminal device with a 12-section module, only 8 sections are activated and assigned, while the remaining 4 can be reassigned or left idle without wasting the entire module's capacity
Data Source
AI summary
Provided is a test apparatus for testing at least one device under test, including: a test module that includes a plurality of test sections, the plurality of test sections testing the device under test by exchanging signals with the device under test; and a plurality of test control sections that control the plurality of test sections, where the test module includes the plurality of test sections; a setting storage section that stores setting as to which of the plurality of test control sections should be associated with each of the plurality of test sections; and an interface section that is connected to the plurality of test sections, provides an access request issued from one of the plurality of test control sections and directed to the test module, to a test section associated with the test control section, and is able to set, independently for each of the plurality of test sections, which of the plurality of test control sections should control the test section.