Dynamic Test Pattern Control for Adaptive Device Maintenance

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Solution Overview

Problem

Conventional device maintenance methods face inefficiencies due to fixed test patterns, leading to prolonged maintenance operations, inability to adapt to changing conditions, and increased test times, especially when output levels or interval times cannot be checked within predetermined intervals.

Innovation Solution

A device maintenance apparatus with a test executor that adjusts output signals based on a dynamic test pattern, allowing for real-time changes in output levels and interval times through an interruption instruction system, enabling operators to modify the simulation signal output during tests without restarting the pattern.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If a fixed test pattern is used from beginning to end, then the test pattern can be saved and reused for safe and efficient operations, but the simulation signal cannot be changed in the middle of the test and maintenance efficiency cannot be improved

Engineering Contradiction:
Improveability to change simulation signal during testVSAvoidcomplexity of test pattern control
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The test pattern is made dynamic by allowing interruption and modification during execution. The control device can receive interruption instructions to change the simulation signal output at any point during the test, transforming the previously static test pattern into an adaptable process that responds to real-time maintenance needs

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The system allows operators to directly interrupt and modify the test pattern execution without requiring system restart or complex reconfiguration. The maintenance apparatus serves itself by enabling on-the-fly adjustments to the simulation signal parameters based on observed device behavior during testing

Inventive Principle:
Principle #25Self-service

2Productivity

If the test pattern runs from beginning to end without interruption, then the test can be completed automatically, but test time is prolonged when output levels or interval times cannot be checked within predetermined intervals

Engineering Contradiction:
Improvemaintenance operation efficiencyVSAvoidtest completion time
Core Design Contradiction:
ProductivityVSLoss of time

Solution Approach 1:

When a simulation signal output cannot be checked within the predetermined interval time, the system skips waiting for the full interval to elapse and proceeds to interrupt the test pattern early. This allows the maintenance operation to continue without being blocked by excessive waiting time, improving overall productivity

Inventive Principle:
Principle #21Skipping (Rushing through)

Solution Approach 2:

The system monitors the test execution and the ability to check simulation signal outputs in real-time. When feedback indicates that an output level cannot be checked within the expected interval, the system responds by interrupting the test pattern and adjusting the simulation signal output accordingly

Inventive Principle:
Principle #23Feedback

3Productivity

If the simulation signal output is changed in the middle of the test, then maintenance efficiency can be improved, but the fixed test pattern cannot accommodate changing conditions

Engineering Contradiction:
Improvemaintenance operation efficiencyVSAvoidstability of test pattern
Core Design Contradiction:
ProductivityVSStability of the object's composition

Solution Approach 1:

The test pattern transitions from a static, predetermined sequence to a dynamic process that can be interrupted and modified during execution. The simulation signal output parameters can be changed mid-test based on actual device performance observations, allowing the test to adapt to changing conditions while maintaining structured control

Inventive Principle:
Principle #15Dynamics

Data Source

PatentUS11586191B2Device maintenance apparatus, device maintenance method, and non-transitory computer readable storage medium
Publication Date: 2023.02.21 YOKOGAWA ELECTRIC CORP
  • US11586191B2 patent drawing
  • US11586191B2 patent drawing
  • US11586191B2 patent drawing

AI summary

A device maintenance apparatus includes a test executor configured to cause a device to output an output signal based on a test pattern that changes the output signal output from the device with an elapse of time, and a change instructor configured to issue a change instruction for changing at least one of a progress of an output of the output signal based on the test pattern and an output value of the output signal to the test executor in accordance with an instruction input while the test executor causes the device to execute the output of the output signal.