E-field Probe Integrated with Package Lid for RF Signal Measurement
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Solution Overview
Problem
Existing measurement systems for electromagnetic fields lack an efficient and non-destructive method to inductively measure radio-frequency signals within microcircuits, often requiring the lid to be removed, which disrupts the operating environment and increases the risk of damage to the circuit.
Innovation Solution
A measurement apparatus featuring a lid with penetrations for removably affixing signal-conducting probes, including a central conductive pin and a dielectric region, allowing inductive signal transmission without direct contact, and a grounded outer conductive housing for electrical isolation, enabling repeatable measurements while maintaining the circuit's operating environment.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If the lid is removed to access the microcircuit for measurement, then measurement access is improved, but the operating environment is disrupted and the risk of circuit damage increases
Solution Approach 1:
The measurement system is segmented into modular components: the lid with integrated probe, the microcircuit case, and the external measurement device. This allows the lid to be removed and replaced without affecting the circuit board or operating environment, resolving the contradiction by enabling easy measurement access while maintaining circuit safety through non-invasive lid-only manipulation.
Solution Approach 2:
The integrated probe serves as an intermediary element that bridges the gap between the external measurement system and the internal microcircuit environment. It allows electromagnetic field measurements to be taken through the lid penetration without direct contact with the circuit, enabling measurement access while preserving circuit integrity and operating conditions.
2Measurement precision
If direct contact measurement is used to improve signal strength, then measurement sensitivity is improved, but the risk of circuit damage and measurement interference increases
Solution Approach 1:
The probe with its conductive pin and dielectric coating acts as an intermediary that enables electromagnetic field coupling without direct electrical contact. The dielectric coating on the pin provides electrical isolation while maintaining inductive coupling capability, allowing sensitive signal detection without the harmful effects of direct contact such as short circuits or measurement interference.
Solution Approach 2:
The system replaces direct mechanical/electrical contact measurement with inductive electromagnetic field coupling. The probe detects signals through magnetic field induction rather than direct electrical connection, improving measurement precision while eliminating contact-related damage risks and interference.
3Measurement precision
If the probe is permanently fixed to improve measurement stability, then measurement repeatability is improved, but the adaptability to different measurement points is reduced
Solution Approach 1:
The measurement system is divided into separable components: the probe is removably affixed to the lid rather than permanently fixed. This segmentation allows the probe to be repositioned or removed entirely, providing adaptability to different measurement points while maintaining measurement stability when affixed through consistent positioning features on the lid.
Solution Approach 2:
The probe-lid connection is designed to be dynamic rather than static, allowing the probe to be easily installed, removed, and repositioned. This dynamic attachment mechanism provides both measurement repeatability (when firmly affixed) and adaptability (when repositioned), resolving the contradiction between stability and flexibility.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution allows for precise, repeatable measurement of radio-frequency signals within microcircuits without damaging the circuit, improving measurement accuracy and reducing interference, while maintaining the circuit's operating environment.
Implementation Method 1
The probe includes a central conductive pin. The central conductive pin transmits to a connection outside the case a radio-frequency signal inductively received from a source inside the case.
Implementation Method 2
The probe also includes a dielectric region radially surrounding a portion of the central conductive pin, and a grounded outer conductive housing radially surrounding the dielectric region and electrically isolated from the central conductive pin by the dielectric region.
Data Source
AI summary
A measurement apparatus is disclosed. The measurement apparatus includes a lid configured to be removably affixed to a microcircuit case. One or more penetrations through the lid allow insertion of a signal-conducting probe. The probe is removably affixed to the lid at the site of the penetration. The probe includes a central conductive pin. The central conductive pin transmits to a connection outside the case a radio-frequency signal inductively received from a source inside the case. The probe also includes a dielectric region radially surrounding a portion of the central conductive pin, and a grounded outer conductive housing radially surrounding the dielectric region and electrically isolated from the central conductive pin by the dielectric region.