Electro-absorption Modulator Crystalline Oxide Buffer

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Solution Overview

Problem

The integration of electro-absorption modulators (EAMs) on silicon-on-insulator (SOI) platforms faces challenges due to the difficulty in achieving thin, uniform silicon layers without high optical losses and complex fabrication processes, particularly with the use of Ge buffers, which hinders high-density, low-cost photonics integration.

Innovation Solution

The introduction of a crystalline oxide layer replaces the buried oxide layer, allowing for the epitaxial growth of SiGeSn or other waveguide materials directly on the silicon substrate, reducing optical losses and simplifying the fabrication process by eliminating the need for a Ge buffer and enabling a PIN junction for modulation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a Ge buffer layer is used to enable SiGeSn material growth on silicon substrate, then the EAM can function in the O-band, but optical losses increase and fabrication complexity increases

Engineering Contradiction:
ImproveEAM functionality in O-bandVSAvoidoptical losses
Core Design Contradiction:
ReliabilityVSLoss of energy

Solution Approach 1:

The patent introduces a crystalline oxide buffer layer (such as SrTiO3, BaTiO3, or PbZr1-xTixO3) as an intermediary between the silicon substrate and the SiGeSn waveguide layer. This crystalline oxide buffer enables epitaxial growth of SiGeSn on silicon substrate while maintaining low optical losses, replacing the traditional Ge buffer layer that causes high optical losses in the O-band.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Reliability

If a Ge buffer layer is used to enable SiGeSn material growth on silicon substrate, then the EAM can function in the O-band, but fabrication process complexity increases

Engineering Contradiction:
ImproveEAM functionality in O-bandVSAvoidfabrication process complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The crystalline oxide buffer layer serves as a mediator that simplifies the fabrication process by enabling direct epitaxial growth of SiGeSn on silicon substrate without requiring complex Ge buffer layer deposition and thickness control processes. The crystalline oxide buffer can be grown using standard MOCVD or MBE techniques, reducing overall fabrication complexity.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Loss of energy

If a thin silicon layer is used to reduce optical losses, then coupling efficiency improves, but manufacturing precision requirements increase

Engineering Contradiction:
Improveoptical lossesVSAvoidsilicon layer thickness uniformity
Core Design Contradiction:
Loss of energyVSManufacturing precision

Solution Approach 1:

The crystalline oxide buffer layer acts as an intermediary that relaxes the manufacturing precision requirements for the silicon device layer thickness. By providing a compliant intermediate layer, it allows for thicker silicon device layers (reducing optical losses) while maintaining good coupling efficiency, as the crystalline oxide buffer can accommodate thickness variations without causing significant interface defects.

Inventive Principle:
Principle #24Intermediary (Mediator)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach results in reduced optical losses and facilitates the integration of EAMs with other components on SOI platforms, enabling high-density, high-yield, and low-cost photonics integration while maintaining high coupling efficiency between the light-transmitting medium and the electro-absorption medium.

Implementation Method 1

allowing for the epitaxial growth of SiGeSn or other waveguide materials directly on the silicon substrate

Methodology Applied
Scientific EffectEpitaxy: Epitaxy

Implementation Method 2

electro-absorption modulator (EAM)... creating a PIN junction across which a bias can be applied to create a modulation region

Methodology Applied
Scientific EffectElectro-absorption: Electro-Optic Effects

Data Source

PatentUS10838240B2Electro-absorption modulator
Publication Date: 2020.11.17 SICILY MERGER SUB II INC
  • US10838240B2 patent drawing
  • US10838240B2 patent drawing
  • US10838240B2 patent drawing

AI summary

An optoelectronic device comprising: a silicon-on-insulator (SOI) substrate, the substrate comprising: a silicon support layer; a buried oxide (BOX) layer on top of the silicon support layer; and a silicon device layer on top of the BOX layer; a waveguide region, where a portion of the silicon device layer and a portion of the BOX layer underneath the portion of the device layer have been removed, the portion of the BOX layer having been replaced with a layer of silicon and a layer of crystalline oxide on top of the silicon; and a waveguide structure located directly on top of the crystalline oxide layer, the waveguide structure including a P doped region, and an N doped region with an intrinsic region in-between, creating a PIN junction across which a bias can be applied to create a modulation region.