Wafer-Scale EBCMOS Imager Arrays With TMSE Gain Stacking

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Solution Overview

Problem

Conventional image intensifier production techniques fail to efficiently and cost-effectively manufacture multiple image intensifiers simultaneously on a wafer scale, particularly in forming and vacuum sealing the components to achieve consistent and reliable production.

Innovation Solution

The integration of electron bombarded complementary metal oxide semiconductor (EBCMOS) imagers with primary and secondary electron multipliers, utilizing semiconductor fabrication techniques to form EBCMOS imager anodes and secondary electron multipliers on stacked wafers, allowing for concurrent formation and vacuum sealing of multiple image intensifiers across a wafer scale.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If conventional image intensifier production techniques are used, then individual image intensifiers can be manufactured, but production efficiency is low and cost is high due to inability to manufacture multiple units simultaneously

Engineering Contradiction:
Improveproduction efficiencyVSAvoidmanufacturing complexity
Core Design Contradiction:
ProductivityVSEase of manufacture

Solution Approach 1:

The image intensifier is divided into separate functional components (photocathode, electron multipliers, anode) that can be independently fabricated on separate wafers using standard semiconductor processes, then later assembled. This segmentation enables parallel manufacturing of multiple units while maintaining component quality and simplifying the overall production workflow.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Multiple image intensifier components are fabricated on stacked wafers in a three-dimensional arrangement. The wafers are stacked vertically with precise spacing, allowing concurrent fabrication of multiple intensifier units in the vertical dimension rather than sequentially on a single plane, thereby dramatically increasing production efficiency.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Productivity

If multiple image intensifiers are formed on stacked wafers, then production cost decreases and efficiency increases, but vacuum sealing becomes more complex

Engineering Contradiction:
Improveproduction efficiencyVSAvoidvacuum sealing complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

Multiple individual vacuum sealing operations are merged into a single simultaneous vacuum sealing process. The stacked wafers are sealed together as one unit, creating multiple sealed image intensifiers concurrently. This approach reduces the total number of sealing operations, minimizes contamination risk, and simplifies the overall vacuum sealing process despite the increased number of units being produced.

Inventive Principle:
Principle #5Merging (Combining)

3Reliability

If electron gain is enhanced using additional electron multipliers, then image quality at low light levels improves, but device complexity increases

Engineering Contradiction:
Improveimage quality at low light levelsVSAvoidelectron multiplier stages
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

An additional secondary electron multiplier is introduced as an intermediary stage between the photocathode and the final anode. This intermediate multiplication stage amplifies the electron signal before it reaches the final detection layer, providing enhanced gain for low-light conditions while maintaining a structured and manageable device architecture.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

Multiple electron multiplication functions are nested within a compact stacked wafer structure. The primary and secondary electron multipliers are integrated in a nested arrangement where each multiplication stage is contained within the overall device stack, achieving high electron gain without proportionally increasing the device's external dimensions or operational complexity.

Inventive Principle:
Principle #7Nested doll (Nesting)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables the cost-effective and reliable production of multiple image intensifiers with enhanced electron gain, maintaining high image quality across low light levels, suitable for portable applications, by aligning and bonding components on stacked wafers to create co-planar arrays within a vacuum housing.

Implementation Method 1

The photocathode receives the image, converts photons to electrons

Methodology Applied
Scientific EffectPhotoelectric effect: Photoelectric Effect

Implementation Method 2

The imager anode can include a primary electron multiplier. The primary electron multiplier is preferably an electron bombarded device (EBD) with one gain stage

Methodology Applied
Scientific EffectElectron impact multiplication: Electron Impact Desorption

Data Source

PatentUS11810747B2Wafer scale enhanced gain electron bombarded CMOS imager
Publication Date: 2023.11.07 ELBIT SYSTEMS OF AMERICA LLC
  • US11810747B2 patent drawing
  • US11810747B2 patent drawing
  • US11810747B2 patent drawing

AI summary

An apparatus, system and method is provided for producing stacked wafers containing an array of image intensifiers that can be evacuated on a wafer scale. The wafer scale fabrication techniques, including bonding, evacuation, and compression sealing concurrently forms a plurality of EBCMOS imager anodes with design elements that enable high voltage operation with optional enhancement of additional gain via TMSE amplification. The TMSE amplification is preferably one or more multiplication semiconductor wafers of an array of EBD die placed between a photocathode within a photocathode wafer and an imager anode that is preferably an EBCMOS imager anode bonded to or integrated within an interconnect die within an interconnect wafer.