EBSD Crystal Orientation Clustering for Faster Structure Analysis

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Solution Overview

Problem

Existing crystal structure analysis methods using Electron Backscatter Diffraction (EBSD) struggle to effectively analyze and visualize the distribution of crystal directions in solid materials, requiring significant computational resources and time.

Innovation Solution

A crystal structure analysis apparatus and method that includes an EBSD data acquisition module, image generation, clustering, image processing, and rendering modules to generate and display crystal structures in different colors, using adjustable threshold values for clustering to identify valid clusters and visualize crystal directions.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If traditional EBSD data processing methods are used, then crystal structure analysis can be performed, but the computational resources and time required are excessive

Engineering Contradiction:
Improveanalysis speedVSAvoidcomputational resources
Core Design Contradiction:
ProductivityVSUse of energy by moving object

Solution Approach 1:

The patent segments the EBSD data processing into distinct modular components: data acquisition module, image generation module, clustering module, image processing module, and rendering module. Each module handles a specific aspect of the analysis, allowing for optimized computation at each stage and enabling parallel processing where applicable, thereby reducing overall computational burden and analysis time.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent implements adjustable threshold values in the clustering module that can be modified to optimize processing speed and resource usage. By changing clustering parameters and threshold settings, users can balance between analysis depth and computational efficiency, allowing faster processing when high precision is not critical and more thorough analysis when needed.

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If detailed crystal direction distribution is visualized, then analysis precision is improved, but processing complexity increases

Engineering Contradiction:
Improvecrystal direction distribution precisionVSAvoidprocessing complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent introduces an image generation module that creates visual representations of crystal structures as an intermediary between raw EBSD data and final analysis results. This intermediate visual format simplifies the interpretation of complex crystal direction distributions, allowing precise analysis through intuitive color-coded clustering without requiring complex computational processing of the raw angular data.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent uses color coding in the image processing module to represent different crystal directions and clusters. Each cluster is assigned a distinct color based on its orientation, allowing precise visualization of crystal direction distribution through color variations. This visual encoding transforms complex angular data into easily interpretable color maps, improving measurement precision while simplifying processing.

Inventive Principle:
Principle #32Color changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables efficient analysis of crystal structures by extracting and visualizing crystal direction distribution, allowing immediate reflection of parameter adjustments and quick analysis of connection patterns in a typical computing environment.

Implementation Method 1

Electron Backscatter Diffraction (EBSD) is mounted on a scanning electron microscope and may analyze the orientation of the material by detecting reflected electrons (rear scattering electrons) when accelerated electrons are injected into the sample

Methodology Applied
Scientific EffectElectron Backscatter Diffraction: Diffraction

Data Source

PatentEP4711749A1Apparatus and method for analyzing crystal structure
Publication Date: 2026.03.18 LG CHEM LTD
  • EP4711749A1 patent drawingFigure 1
  • EP4711749A1 patent drawingFigure 2
  • EP4711749A1 patent drawingFigure 3A

AI summary

Disclosed is a crystal structure analysis apparatus and method. The crystal structure analysis apparatus includes: an Electron Backscatter Diffraction (EBSD) data acquisition module for acquiring EBSD data for a solid material; an image generation module for generating a shape of the solid material as a first image including a plurality of pixels; a clustering module for performing clustering on the plurality of pixels by using the EBSD data so that the first image includes a plurality of clusters each representing a crystal direction; an image processing module for processing the first image so that the first image is displayed in a different color for each cluster, to generate a second image; and a rendering module for rendering the second image to a display region.