EBSD Sample Mount With 70-Degree Tilt and Open SEM Access
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Solution Overview
Problem
Conventional sample mounts for Electron Backscatter Diffraction (EBSD) often fail to maintain the optimal 70-degree tilt and unimpeded path required for high-quality data acquisition, leading to erroneous images and time-consuming corrective processes.
Innovation Solution
A sample mount with a spring-loaded handle to ensure a 70-degree tilt and an open top design for an unimpeded path, combined with a rotational actuator for precise sample orientation and alignment, allowing for optimal electron detection and image quality.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If conventional sample mounts are used, then the sample can be mounted in the SEM, but the mounting hardware fails to provide the required 70-degree angle, resulting in erroneous EBSD images
Solution Approach 1:
The sample mount is pre-configured with a built-in 70-degree tilt mechanism that automatically orients the sample at the correct angle before insertion into the SEM. This preliminary positioning eliminates the need for complex post-mounting adjustments and ensures accurate EBSD imaging without requiring specialized mounting skills.
Solution Approach 2:
The sample mount incorporates a movable sample holder that can be adjusted between a loaded position (where the sample is inserted) and an operational position (where the sample is tilted to 70 degrees). This dynamic repositioning allows the mount to adapt to different operational requirements while maintaining precise angular orientation during EBSD analysis.
2Manufacturing precision
If conventional circular sample mounts are used, then the sample can be held, but the circumference of the mount prevents the SEM pole piece from being within the optimal 4-15 millimeter range
Solution Approach 1:
The design removes the unnecessary circular circumference and supporting structure from the sample mount, retaining only the essential sample-holding function. This extraction of non-essential elements creates a compact, minimalistic mount that does not interfere with the SEM pole piece positioning, allowing the pole piece to be placed within the optimal 4-15 millimeter range for high-quality EBSD imaging.
3Manufacturing precision
If conventional sample mounts are used, then the sample can be mounted, but the sample is not held perfectly flat at the required tilt angle, requiring time-consuming correction and verification processes
Solution Approach 1:
The sample mount incorporates a self-flattening mechanism with a spring-loaded handle that automatically applies pressure to ensure the sample surface is perfectly flat and aligned at the 70-degree tilt angle. This self-correcting feature eliminates the need for manual adjustment and verification by the operator, saving time and ensuring consistent precision without requiring skilled intervention.
4Ease of operation
If the sample is mounted with a small angle (near 0 degrees), then the mounting is simple, but the number of diffracted electrons is undetectable by EBSD detectors
Solution Approach 1:
The sample mount is pre-configured with a built-in 70-degree tilt mechanism that automatically orients the sample at the correct angle before insertion into the SEM. This preliminary positioning eliminates the need for complex post-mounting adjustments and ensures accurate EBSD imaging without requiring specialized mounting skills.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution ensures accurate and efficient EBSD data acquisition by maintaining the sample at the optimal angle and distance from the SEM pole piece, reducing the need for post-processing and enhancing image quality.
Implementation Method 1
a spring-loaded handle received through the back wall and configured to press the sample against the interior face of the front surface
Implementation Method 2
the SEM produces an electron beam projected onto a sample. The electron beam may only diffract within a 5-10 nanometer depth of the sample
Implementation Method 3
electrons diffract out of the sample
Implementation Method 4
An EBSD detector (e.g., a CCD or CMOS camera) detects the diffracted electrons, which may be compiled to form an image of the sample
Data Source
AI summary
A sample mount having a bottom surface, a front surface, and a second portion is disclosed. The first portion is perpendicular to the bottom surface. The second portion has an external surface and an internal surface and extends from the first portion to form a 70-degree angle relative to the bottom surface. The sample mount may also have a top surface, an opening extending through the second portion of the front surface, and a receiving area configured to receive a sample, wherein the top surface presents an unimpeded path between the sample and an SEM pole piece. The sample mount may include a spring-loaded handle configured to push the sample against the internal surface of the second portion of the front surface, wherein pushing the sample against the internal surface places the sample at the 70-degree angle relative to the bottom surface.