ECC Error Injection Using M-Sequence for Memory Test Acceleration
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Testing error correction code systems in memory devices is time-consuming and costly due to the difficulty in providing erroneous data for ECC encoders/decoders to detect and correct, especially in dynamic random access memory devices where test data degradation occurs over a long period.
Innovation Solution
Incorporating an error injection module within the memory device to generate and write pseudo random erroneous data into memory storage areas, allowing the ECC encoder/decoder to detect and correct errors efficiently, thereby reducing testing time and costs.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If natural data degradation is used to test ECC encoders/decoders, then testing accuracy is maintained, but testing time increases significantly
Solution Approach 1:
The patent applies preliminary action by pre-generating erroneous test data using an error injection module before the actual ECC testing begins. This allows the testing process to start immediately with already-prepared error-containing data, eliminating the time-consuming wait for natural data degradation while maintaining full testing accuracy.
Solution Approach 2:
The patent introduces an error injection module as an intermediary component that artificially introduces errors into test data. This intermediary mechanism replaces the slow natural data degradation process, providing a controlled and rapid method to generate the same testing conditions that would otherwise require extended waiting periods.
2Productivity
If error injection module is added to generate pseudo random erroneous data, then testing speed increases, but device complexity increases
Solution Approach 1:
The error injection module is designed to work with existing ECC encoder/decoder structures without requiring fundamental architectural changes. It can be integrated into various memory device configurations and works universally with different ECC schemes, making the added complexity worthwhile by enabling rapid testing across multiple device types.
Solution Approach 2:
The error injection module is integrated within the memory device itself, allowing the device to perform self-testing with erroneous data generation. This self-service capability eliminates the need for external test equipment to artificially create errors, reducing overall system complexity while maintaining high testing speed.
3Measurement precision
If test data degradation is waited for naturally, then error detection accuracy is maintained, but manufacturing cost increases
Solution Approach 1:
By pre-generating erroneous test data within the device before shipment, the patent eliminates the need for costly extended testing periods at manufacturing facilities. The error injection module creates all necessary test conditions during a brief initialization phase, reducing manufacturing time and associated costs while preserving full error detection accuracy.
Solution Approach 2:
The error injection module serves as an intermediary that provides controlled error conditions without requiring expensive natural degradation processes. This intermediary mechanism enables manufacturers to perform comprehensive ECC testing quickly and cost-effectively during production, avoiding the high costs associated with waiting for natural data degradation.
Data Source
AI summary
Improved apparatus, systems and methods, such as those for testing an error correction code (ECC) encoder/decoder for solid-state memory devices, are provided. In one or more embodiments, the improved systems and methods deliberately inject errors into memory storage areas of memory devices to test the operation of the ECC encoder/decoder.