ECC Decoder Status Flag for Adaptive Memory Error Correction
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Solution Overview
Problem
Current semiconductor memory devices and controllers perform limited error correction code (ECC) decoding operations, lacking flexibility to adapt to different error types, which affects data reliability.
Innovation Solution
A semiconductor memory device and controller system that generates a decoding status flag (DSF) to indicate error types, allowing for selective ECC decoding operations based on the flag, enabling efficient error correction and detection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If a single fixed ECC decoding operation is performed, then the device complexity is reduced, but the adaptability to different error types deteriorates
Solution Approach 1:
The patent implements dynamic ECC decoding by selecting different decoding operations based on the detected error type. The system transitions from a static, fixed decoding approach to a dynamic one where the decoding method adapts to the specific error conditions detected in the data, thereby improving versatility without permanently increasing hardware complexity.
Solution Approach 2:
The patent changes the parameters of the ECC decoding operation based on the error type detected. By monitoring error patterns and adjusting the decoding strategy accordingly, the system achieves adaptability to different error types while maintaining a relatively simple device structure through parameter adjustment rather than multiple fixed configurations.
2Reliability
If multiple ECC decoding operations are implemented, then the reliability for different error types is improved, but the device complexity increases
Solution Approach 1:
The patent segments the ECC decoding process into multiple specialized decoding operations, each optimized for specific error types. Instead of implementing all decoding capabilities simultaneously, the system divides the decoding task into separate operational modes that can be selectively activated based on the detected error pattern, thereby improving reliability without requiring all decoding mechanisms to be permanently present.
Solution Approach 2:
The patent creates a universal ECC decoding system that can perform multiple decoding operations through a single multi-functional decoder. The decoder is designed to handle different error types by switching between decoding modes, achieving the reliability benefits of multiple specialized decoders while maintaining a more compact and less complex overall device structure.
3Measurement precision
If error detection and correction is performed without differentiation, then the operation speed is maintained, but the measurement precision of error types deteriorates
Solution Approach 1:
The patent performs preliminary error detection and classification before executing the appropriate correction operation. By quickly identifying the error type in advance, the system can then select the most suitable decoding operation, achieving both precise error type identification and maintaining operational speed through efficient pre-screening and classification.
Solution Approach 2:
The patent implements a feedback mechanism where the results of initial error detection are used to guide the selection of subsequent decoding operations. The system continuously monitors error patterns and adjusts the decoding strategy based on this feedback, enabling precise error type identification while maintaining fast operation through iterative refinement rather than exhaustive analysis.
Data Source
AI summary
Disclosed are a semiconductor memory device, a controller, a memory system, and an operation method thereof. The semiconductor memory device includes a memory cell array including a plurality of memory cells, and an error correcting code (ECC) decoder configured to receive first data and a parity output from selected memory cells of the memory cell array. The ECC decoder generates a syndrome based on the first data and the parity, generates a decoding status flag (DSF) indicating a type of an error of the first data by the syndrome, and outputs the second data and the DSF to an external device outside of the semiconductor memory device when a read operation of the semiconductor memory device is performed.