Eccentric Spring Contact Probe for Reliable Electrical Testing
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Solution Overview
Problem
Contact probes with relatively small loads experience increased resistance values over time, leading to inaccurate electrical testing results due to resistance exceeding allowable limits, affecting the reliability of electrical component testing.
Innovation Solution
The contact probe design incorporates a spring positioning part with an eccentric structure, such as a semicircular cone or semicircular-like cone, which increases the energized contact load, preventing resistance values from exceeding allowable limits even after numerous tests.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If a contact probe with relatively small load is used, then the device complexity is reduced, but the resistance value increases with the number of electrical tests, exceeding the allowable resistance value and deteriorating testing reliability
Solution Approach 1:
The spring positioning part is designed as an eccentric structure where the spring axis is offset from the central axis of the plunger. This asymmetric configuration creates a larger energized contact load on the contact probe, preventing resistance value increase even after numerous electrical tests, thereby resolving the contradiction between simple device structure and reliable electrical testing
Solution Approach 2:
The invention changes the geometric parameters of the spring positioning part by introducing an offset distance between the spring axis and plunger central axis. This parameter modification transforms the contact load characteristics, ensuring the energized contact load remains sufficiently high to maintain low resistance values throughout the testing process
2Productivity
If the number of electrical tests increases, then the productivity is improved, but the resistance value of the contact probe exceeds the allowable resistance value, affecting measurement precision
Solution Approach 1:
The eccentric spring positioning structure is pre-configured to generate sufficient energized contact load before testing begins. This preliminary structural arrangement ensures that even after extensive electrical tests, the contact probe maintains adequate contact pressure and low resistance values, preserving measurement precision throughout high-volume production testing
3Ease of manufacture
If a conventional spring positioning part is used, then the ease of manufacture is improved, but the energized contact load is insufficient, causing resistance values to exceed allowable limits
Solution Approach 1:
The spring positioning part employs an asymmetric eccentric design where the spring is positioned offset from the plunger's central axis. This configuration naturally increases the energized contact load without complicating the manufacturing process, as the eccentric structure can be integrated into the existing plunger geometry using standard machining operations
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The eccentric structure significantly enhances the energized contact load, ensuring that resistance values remain within acceptable limits, thereby improving the reliability and accuracy of electrical testing.
Implementation Method 1
a spring arranged in the receiving cavity
Data Source
AI summary
The embodiments of the present disclosure provide a contact probe and a socket for testing an electrical component. The contact probe includes: a tubular structure in which a receiving cavity is formed, and a contact part for contacting with a terminal of a first electrical component is provided at a first end of the tubular structure; a spring arranged in the receiving cavity; a plunger connected with the tubular structure in a slidable manner, wherein a first end of the plunger is provided with a spring positioning part, which abuts against the spring and is an eccentric structure arranged offset from a central axis of the plunger, a second end of the plunger projects from a second end of the tubular structure. In the contact probe of the embodiment of the present disclosure, by means of setting the spring positioning part as an eccentric structure, the effect of increasing the energized contact load of the contact probe can be achieved, thereby reducing the occurrence of the resistance value of the contact probe being greater than the allowable resistance value, and further improving the reliability of electrical testing of sockets.