Eccentric X-ray Beam Blocking Element for Divergence Control
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Solution Overview
Problem
Existing X-ray diffractometers face challenges in adjusting convergence and divergence angles of the X-ray beam due to the fixed design of reflective optics, which requires expensive and sensitive micrometer screws, and is difficult to implement in a gas-tight housing, limiting control over beam properties.
Innovation Solution
An X-ray optical device with a beam blocking unit featuring a rotating shaft and an eccentrically mounted beam blocking element that can be rotated to adjust beam overlap positions, allowing for continuous adjustment of beam properties like divergence angles and intensity by simply changing the angular position, eliminating the need for expensive micrometer screws and improving control over beam settings.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If micrometer screws or fine-threaded screws are used to adjust the aperture for controlling X-ray beam properties, then the beam convergence and divergence angles can be adjusted, but the device becomes expensive, sensitive to external influences, and difficult to implement in a gas-tight housing
Solution Approach 1:
The patent replaces the mechanical micrometer screw system with a piezoelectric actuator that uses electrical signals to control the aperture position. The piezoelectric element converts voltage directly into mechanical displacement, eliminating the need for complex mechanical threads and screws while achieving precise control of the aperture position for beam angle adjustment.
Solution Approach 2:
The patent employs a pneumatic or hydraulic actuation system to move the aperture blade. By using pressurized gas or liquid to drive the aperture adjustment, the system eliminates sensitive mechanical screw threads while maintaining precise control capability and enabling integration into gas-tight housings without compromising the adjustment mechanism.
2Adaptability or versatility
If fixed X-ray optics are used, then the device structure is simple, but the beam properties such as convergence and divergence angles cannot be adjusted to meet different experimental needs
Solution Approach 1:
The patent introduces dynamic adjustability to the previously static aperture system. The aperture blade can now be moved to different positions along the optical path using piezoelectric or pneumatic actuation, allowing the beam convergence and divergence angles to be dynamically adjusted according to different experimental requirements while maintaining a relatively simple overall optics structure.
Solution Approach 2:
The patent enables change of beam parameters (convergence angle, divergence angle, beam size) by adjusting the aperture position. By varying the aperture's location in the optical path, different beam properties can be achieved without changing the fundamental optics design, thus providing versatility while keeping the device structure simple.
3Ease of operation
If adjustable apertures with micrometer screws are implemented, then beam portions can be occluded to control convergence and divergence angles, but the linear movement control becomes difficult due to motion parameters needing precise definition
Solution Approach 1:
The patent replaces the mechanical micrometer screw system with a piezoelectric actuator that uses electrical signals to control the aperture position. The piezoelectric element converts voltage directly into mechanical displacement, eliminating the need for complex mechanical threads and screws while achieving precise control of the aperture position for beam angle adjustment.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution enables easy adjustment of beam properties, enhancing the flexibility and precision of X-ray beam settings without the need for expensive components, improving the control over beam divergence and intensity, and simplifying the adjustment process, thus improving the X-ray analysis capabilities.
Implementation Method 1
The beam blocking element is mounted eccentrically on the rotating shaft such that the beam blocking element is movable into different beam overlap positions for blocking off desired beam portions when the beam blocking element is eccentrically rotated around the rotating shaft axis
Data Source
AI summary
An X-ray diffraction system includes an X-ray detector that is configured to detect diffracted X-rays diffracted from a sample when a surface of the sample is irradiated with X-rays. The apparatus may include a counter arm which rotates around a rotation center axis set within the surface of the sample while the X-ray detector is installed on the counter arm and a plate-like X-ray shielding member that is installed on the counter arm and rotated together with the X-ray detector.