Eccentricity Measurement Using Single Optical System
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Solution Overview
Problem
Existing methods for measuring eccentricity in optical elements, such as lenses, require dedicated measurement optical systems for each lens due to varying radii of curvature, leading to increased facility costs and prolonged measurement preparation times.
Innovation Solution
An eccentricity measuring method that uses a single measurement optical system to measure the relative eccentricity between optical surfaces by capturing light source images at specific positions on both surfaces, allowing for the calculation of eccentricity regardless of the radius of curvature, utilizing a Kohler illumination system and a general microscope camera.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If dedicated measurement optical systems are prepared for each lens based on radius of curvature, then measurement precision is improved, but facility cost increases and measurement preparation time is prolonged
Solution Approach 1:
The patent applies universality by developing a single measurement optical system that can measure eccentricity for optical elements with different radii of curvature. The system uses a microscope camera and Kohler illumination that can adapt to various curvature radii through software processing and optical path adjustments, eliminating the need for dedicated measurement systems for each lens type.
Solution Approach 2:
The patent utilizes parameter changes by adjusting the focal length of the microscope objective and the position of the measurement optical system to accommodate different radii of curvature. The measurement wavelength and illumination parameters are also optimized for different optical elements, allowing one system to handle multiple measurement scenarios.
2Measurement precision
If dedicated measurement optical systems are prepared for each lens based on radius of curvature, then measurement precision is improved, but setup time increases
Solution Approach 1:
The universal measurement system eliminates the need to physically reconfigure dedicated optical systems for each lens type. The system maintains measurement precision across different radii of curvature through software-based adaptation and adjustable optical parameters, significantly reducing setup time.
Solution Approach 2:
The patent implements preliminary action by pre-calibrating the measurement system with reference data for various radii of curvature. The system stores measurement parameters and optical paths for different lens types, allowing quick retrieval and adjustment rather than full reconfiguration, thus reducing preparation time while maintaining precision.
3Measurement precision
If autocollimation methods are used with relay lenses selected according to radius of curvature, then measurement precision is improved, but facility cost increases
Solution Approach 1:
The patent replaces the need for multiple relay lenses with a universal microscope camera system that can handle different radii of curvature. The Kohler illumination system provides uniform lighting across various optical elements, and the measurement software adapts to different curvature radii, eliminating the need to purchase and maintain multiple dedicated relay lenses.
Solution Approach 2:
The patent uses optical copying principles where the measurement system creates an image of the optical element's surface that can be analyzed digitally. This allows the same physical measurement system to effectively 'copy' and measure different radii of curvature without requiring physical adaptation of the optical path, reducing facility costs.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables efficient and cost-effective measurement of eccentricity in optical elements with reduced setup times, as the same measurement system can be used across different lenses, independent of their curvature radii.
Implementation Method 1
a first position of an image of a light source formed by reflection at a first optical surface is measured
Implementation Method 2
utilizing a Kohler illumination system and a general microscope camera
Data Source
AI summary
In an eccentricity measuring method according to the present invention, a first position of a light source image formed by reflection at one optical surface is measured (S2), a predetermined second position related to another optical surface is measured (S3), and a relative eccentricity between both optical surfaces is calculated based on the first and second positions (S5). Therefore, the eccentricity measuring method enables measurement of eccentricity by a same measurement optical system regardless of a radius of curvature of an optical surface of an optical element.