Eddy Current Coil Oscillating Signal Map for Mill Roll Defect Location

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Solution Overview

Problem

Existing defect detection systems for mill rolls, particularly those using eddy current inspection, struggle to accurately identify and locate circumferential defects due to constant frequency across defects, leading to missed detections and cumbersome precise location processes.

Innovation Solution

An apparatus with a test head and eddy current coil that records and processes non-demodulated oscillating signals to generate a two-dimensional map, allowing for the identification and precise location of defects on a metallic roll surface, independent of roll speed and rotation, using a touch screen interface for user selection and automated movement to the defect area.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If demodulation and filtering processes are used to extract defect information from carrier waves, then longitudinal defects can be detected, but circumferential defects go undetected because the frequency remains constant across them

Engineering Contradiction:
Improvedefect detection accuracyVSAvoidcircumferential defect information
Core Design Contradiction:
ReliabilityVSLoss of information

Solution Approach 1:

The patent extracts only the necessary information for defect detection by using raw oscillating signal data without demodulation. The system takes out the essential frequency and amplitude characteristics directly from the eddy current coil signals, eliminating the need for demodulation and filtering processes that remove critical circumferential defect information.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

Instead of using the conventional approach of demodulating the carrier wave to extract defect information, the patent inverts the approach by using the raw oscillating signals directly. This reversal allows the system to detect both longitudinal and circumferential defects by preserving the original signal characteristics that contain information about both defect types.

Inventive Principle:
Principle #13The other way round (Inversion)

2Measurement precision

If traditional detection systems are used, then defect detection is possible, but precise location of defects is cumbersome and time consuming

Engineering Contradiction:
Improvedefect location precisionVSAvoidtime for defect location
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent replaces manual mechanical measurement and location methods with automated electronic signal processing. The system uses computer-controlled analysis of oscillating signal patterns to automatically determine defect locations, eliminating the need for manual measurement and reducing both time and human error.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent creates an electronic copy or map of the mill roll surface by recording oscillating signals at multiple positions. This digital representation allows rapid analysis and precise location of defects without physical contact or manual inspection, significantly reducing the time required for defect location while maintaining high precision.

Inventive Principle:
Principle #26Copying

3Device complexity

If de-modulation filtering is applied to remove background noise, then signal processing is simplified, but circumferential defects are missed because frequency changes are minimal

Engineering Contradiction:
Improvesignal processing complexityVSAvoidcircumferential defect detection
Core Design Contradiction:
Device complexityVSReliability

Solution Approach 1:

The patent extracts defect information directly from the raw oscillating signals without applying demodulation filtering. By taking out only the essential signal characteristics (frequency and amplitude variations) directly from the eddy current coil outputs, the system maintains simplicity while preserving the information needed to detect circumferential defects.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent changes the approach from frequency demodulation to direct analysis of oscillating signal parameters. Instead of converting the carrier wave to a lower frequency signal, the system analyzes the original high-frequency oscillations directly, looking for characteristic patterns that indicate both longitudinal and circumferential defects.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables efficient detection and precise location of both longitudinal and circumferential defects, improving detection accuracy and reducing the time and complexity of identifying defects on mill rolls, as raw signal data clearly indicates circumferential defects and allows for automated positioning.

Implementation Method 1

a test head movable along the longitudinal length of an underlying surface of the metallic roll mill, the test head including an eddy current coil

Methodology Applied
Scientific EffectEddy currents: Eddy Currents

Implementation Method 2

the product under test passes through or adjacent to an electrical test coil which has been excited by an alternating current. This induces a flow of eddy currents around the test material

Methodology Applied
Scientific EffectElectromagnetic induction: Electromagnetic Induction

Data Source

PatentEP2724152B1Eddy current apparatus and method for detecting defects in a metallic surface
Publication Date: 2024.08.21 SARCLAD LTD
  • EP2724152B1 patent drawingFigure 1
  • EP2724152B1 patent drawingFigure 2(a)~2(b)
  • EP2724152B1 patent drawingFigure 3~4

AI summary

An apparatus and method for detecting defects in a metal surface is disclosed. The apparatus is configured to move an eddy coil relative to an underlying metallic surface along a plurality of generally parallel and adjacent scan paths, and to receive from the eddy coil an oscillating signal induced at said coil as it is moved along each path. A representation of the received oscillating signal in relation to each one of a plurality of adjacent scan areas within each path is recorded, and a two-dimensional grid-like map showing the signal representations relative to each scan area is displayed. Defect location is facilitated by a further function of the > apparatus and method, by which user input to an interface causes a light source to illuminate a selected part of the metallic surface.