Eddy Current Array Probe Embedded Memory Firing Sequence
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Solution Overview
Problem
In eddy current non-destructive inspection (NDI) operations, manually entering and configuring a specific firing sequence for each eddy current array probe is time-consuming, error-prone, and requires additional hardware, affecting system reliability and efficiency when switching between different probes.
Innovation Solution
An intelligent eddy current array probe with an embedded non-volatile memory element stores a firing sequence data table, allowing automatic loading into the NDI system upon connection, eliminating the need for manual configuration through a memory interface that can be programmed via a personal computer or specialized NDI instrument.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Loss of time
If manual configuration of firing sequence is used for each eddy current array probe, then system flexibility is maintained, but time consumption and error rate increase significantly
Solution Approach 1:
The firing sequence data table is pre-stored in the embedded non-volatile memory element of the eddy current array probe during manufacturing. This preliminary action eliminates the need for manual configuration during operation, directly reducing time consumption and operational complexity while maintaining system flexibility through probe-specific optimization.
Solution Approach 2:
The probe automatically provides its own firing sequence configuration through the embedded memory element. When connected to the NDI system, the probe self-configures by having the system read the pre-stored data table from its memory, eliminating manual intervention and reducing both time consumption and potential for human error.
2Adaptability or versatility
If additional hardware components are added to support probe switching, then system adaptability is improved, but device complexity and reliability are negatively affected
Solution Approach 1:
The embedded non-volatile memory element serves multiple functions: storing the firing sequence data table, storing probe identification information, and enabling automatic configuration. This universal storage solution eliminates the need for probe-specific hardware components, reducing device complexity while maintaining adaptability across different probe types.
Solution Approach 2:
The firing sequence configuration data is extracted from the external system and embedded directly into the probe's memory element. This extraction eliminates the need for additional hardware components and manual configuration steps in the external system, simplifying the overall device complexity while maintaining full probe switching capability.
3Productivity
If manual entry of firing sequence is required, then system reliability is maintained, but productivity and time efficiency decrease
Solution Approach 1:
The firing sequence data table is copied from a pre-configured source during manufacturing and stored in the probe's embedded memory. This copying process ensures accurate reproduction of the optimized firing sequence without manual transcription errors, simultaneously improving productivity through automation and maintaining reliability through error-free data transfer.
4Measurement precision
If probe-specific firing sequences are optimized, then measurement precision is improved, but operational complexity increases due to manual configuration requirements
Solution Approach 1:
Each probe is pre-configured with its own optimized firing sequence data table stored in embedded memory during manufacturing. This preliminary optimization action preserves measurement precision by maintaining probe-specific sequences while eliminating operational complexity through automatic loading, allowing operators to simply connect the probe without any configuration steps.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution streamlines the inspection process by automating the firing sequence setup, reducing operator intervention, enhancing reliability, and minimizing errors, while allowing for flexible updates and optimized probe-specific sequences.
Implementation Method 1
an intelligent eddy current array probe with an embedded non-volatile memory element stores a firing sequence data table
Implementation Method 2
an eddy current array probe, comprising a plurality of coils, is placed adjacent to the surface of a material under inspection. At the start of an inspection operation, an NDI instrument coupled to said eddy current array probe energizes one or more coils within the array. This, in turn, induces a current in the material under inspection.
Implementation Method 3
One or more coils within the probe array then sense this induced current and provide a measurement signal to the NDI instrument. By measuring the current induced in a material under inspection, the impedance of said material can be calculated.
Data Source
AI summary
An intelligent eddy current array probe comprising a plurality of coil elements and an embedded non-volatile memory element is disclosed. Prior to coupling the intelligent eddy current array probe to an NDI system, a data table describing a desired firing sequence for the array probe within a given inspection operation is created. This data table is then stored within the embedded non-volatile memory element of the intelligent eddy current array probe such that when the array probe is coupled to the NDI system, the elements of the NDI system can load and execute the stored firing sequence without operator intervention. In this way, a plurality of intelligent eddy current array probes, each with its own firing sequence, can be used interchangeably within a single NDI system without the need for mechanical adjustments to the NDI system.