Eddy Current Array Probe With Offset Coils For Flaw Detection

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Solution Overview

Problem

Eddy current inspection techniques are time-consuming due to the need for repeated scanning in different directions to detect flaws in conductive materials, as the orientation of eddy current probes significantly affects the detection of structural irregularities.

Innovation Solution

An eddy current array probe with offset and overlapping sense coils, multiplexed drive coils, and differential sensing configurations that allow for omnidirectional detection of both short and long flaws, reducing the need for multiple directional scans and enhancing sensitivity.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a typical eddy current probe uses single-directional sensing coils, then the device complexity is low, but the measurement precision deteriorates because flaw detection is highly dependent on coil orientation relative to flaw orientation

Engineering Contradiction:
Improveflaw detection accuracyVSAvoidprobe structure complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The probe is segmented into multiple eddy current channels, each containing sensing coils oriented in different directions (e.g., 0°, 45°, 90°, 135°). This segmentation allows the probe to detect flaws in multiple orientations simultaneously, improving measurement precision without requiring the entire probe to be complex in all aspects - each channel remains relatively simple but the combination provides comprehensive coverage

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The probe achieves multi-functionality by incorporating sensing coils with different orientations within a single probe body. This allows the same probe to detect flaws in various orientations (longitudinal, transverse, diagonal) without needing multiple separate probes, thereby improving measurement precision across different flaw types while maintaining reasonable device complexity through a unified design

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Measurement precision

If repeated scans in different directions are performed to ensure flaw detection, then the measurement precision improves, but the productivity deteriorates due to time-consuming inspection processes

Engineering Contradiction:
Improveflaw detection reliabilityVSAvoidinspection speed
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The probe performs preliminary action by pre-configuring multiple sensing coil orientations before the inspection begins. This allows the probe to simultaneously detect flaws in various orientations during a single pass, eliminating the need for multiple repeated scans and thereby improving productivity while maintaining high measurement precision through comprehensive flaw detection capability

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The probe enables continuous useful action by maintaining flaw detection capability across all orientations throughout a single linear scan. The multiple sensing coil orientations work continuously and simultaneously during the scan, ensuring that flaws in any orientation can be detected without interrupting the scan to reposition or reorient the probe, thus improving productivity while preserving measurement precision

Inventive Principle:
Principle #20Continuity of useful action

3Measurement precision

If multiple directional scans are conducted to detect all possible flaws, then the measurement precision improves, but the loss of time increases due to repeated scanning operations

Engineering Contradiction:
Improvecompleteness of flaw detectionVSAvoidinspection duration
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The probe segments the sensing function into multiple directional channels within a single probe unit. Each channel is optimized for detecting flaws in specific orientations, allowing comprehensive flaw detection (improving measurement precision) during a single scan pass. This eliminates the need for multiple repeated scans and reduces inspection duration (reducing time loss) while maintaining complete flaw detection capability

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The probe merges multiple sensing coil orientations into a single integrated probe body. This combination allows the probe to perform the function of multiple separate probes simultaneously, achieving complete flaw detection across all orientations in one scan. This merging approach improves measurement precision by ensuring all flaw types are detected while reducing time loss by eliminating the need for sequential scanning operations

Inventive Principle:
Principle #5Merging (Combining)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution enables efficient detection of flaws in any orientation, reducing inspection time and improving sensitivity to structural deformations, including those on non-regular surfaces, by utilizing offset and overlapping sense coils and multiplexed drive coils, resulting in a higher signal-to-noise ratio and reduced crosstalk.

Implementation Method 1

The drive coil is energized via a current to create a magnetic field. The magnetic field induces eddy currents in the conductive materials of the test specimen

Methodology Applied
Scientific EffectElectromagnetic induction: Electromagnetic Induction

Implementation Method 2

The magnetic field induces eddy currents in the conductive materials of the test specimen, which generate a secondary magnetic field

Methodology Applied
Scientific EffectElectromagnetic induction: Electromagnetic Induction

Implementation Method 3

The secondary magnetic field may induce a potential and/or a potential difference in the sensing coils

Methodology Applied
Scientific EffectElectromagnetic induction: Electromagnetic Induction

Data Source

PatentUS8884614B2Eddy current array probe
Publication Date: 2014.11.11 BAKER HUGHES CO
  • US8884614B2 patent drawing
  • US8884614B2 patent drawing
  • US8884614B2 patent drawing

AI summary

Present embodiments include eddy current array probes having differential coils capable of detecting both long and short flaws in a test specimen and, additionally or alternatively, multiplexed drive coils. For example, an eddy current array probe may include a first plurality of eddy current channels disposed in a first row and a second plurality of eddy current channels disposed in a second row. The first plurality and second plurality of eddy current channels overlap in a first direction but do not overlap in a second direction. The probe also includes a semi-circular drive coil disposed proximate to the first plurality and second plurality of eddy current channels and configured to generate a probing magnetic field for each sense coil of the eddy current channels.