Eddy Current Brake Oscillation Damping for Surface Measuring Probe
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Solution Overview
Problem
Surface measuring devices face inaccuracies due to oscillations caused by external and internal disturbances, which are not effectively mitigated by existing oscillation insulation systems, especially in production facility settings where external disturbances dominate, leading to skewed surface characteristic values and reduced measuring accuracy.
Innovation Solution
The integration of oscillation damping means, specifically an eddy current brake between the probe base body and the device base body, which provides oscillation rate-dependent damping, effectively reducing the impact of oscillations on measuring accuracy without significant equipment outlay or impairment to the measurement process.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If oscillation insulation systems are used to reduce external vibrations, then measurement accuracy is improved, but the system complexity and equipment outlay increase
Solution Approach 1:
The patent extracts the oscillation damping function from the base plate and relocates it to the probe base body. By placing oscillation damping means (such as viscoelastic dampers) directly on the probe base body, the system eliminates the need for complex base plate isolation systems while still achieving effective oscillation reduction. This extraction simplifies the overall system structure.
Solution Approach 2:
The patent introduces oscillation damping means as an intermediary element between the probe base body and the external environment. These dampers act as mediators that absorb and dissipate oscillation energy without requiring complex mechanical isolation systems. The damping means serve as a simple yet effective intermediary that reduces transmitted vibrations.
2Measurement precision
If oscillation damping means are added to reduce probe oscillations, then measuring accuracy is improved, but device complexity increases
Solution Approach 1:
The patent applies oscillation damping means locally at the probe base body, specifically at the location where oscillations most directly affect measurement accuracy. Rather than damping the entire measuring device, the solution targets only the critical oscillation source area. This localized approach reduces complexity compared to system-wide damping solutions.
Solution Approach 2:
The oscillation damping means are designed to automatically compensate for probe oscillations without requiring external control systems or complex mechanisms. The dampers self-regulate by dissipating oscillation energy through their material properties, providing passive damping that simplifies the overall device structure.
3Productivity
If the measuring device is placed near production facilities to increase productivity, then output is improved, but external oscillation disturbances increase
Solution Approach 1:
The patent applies preliminary anti-action by pre-installing oscillation damping means on the probe base body before the measuring device is exposed to external vibrations. The dampers are already in place to immediately counteract oscillation forces when the device operates near production facilities, preventing harmful vibrations from affecting measurements rather than reacting to them after they occur.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution significantly reduces measuring inaccuracies caused by oscillations, allowing for higher measuring speeds and improved accuracy, even in noisy production environments, while maintaining a low equipment cost and minimal disruption to the measurement procedure.
Implementation Method 1
oscillation damping means, specifically an eddy current brake between the probe base body and the device base body, which provides oscillation rate-dependent damping
Data Source
AI summary
Surface measuring device for measuring a surface of a workpiece has a device base body, and a measuring probe that by use of a feed apparatus is movable along a feed axis relative to a workpiece to be measured. The measuring probe has a probe base body and a probe element, connected to the probe base body, for scanning the workpiece in the direction of a measuring axis. The probe base body is connected to the measuring device base body via the feed apparatus. An oscillation damper is associated with the measuring probe, and is designed and configured for oscillation rate-dependent damping of oscillations of the probe base body of the measuring probe, and is active between the probe base body and the device base body.