Eddy Current Flaw Detection with Shape-Based Probe Sensitivity Correction

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Solution Overview

Problem

Eddy current flaw detection tests face complications due to probe sensitivity variations caused by differences in component surface shapes, necessitating probe replacement and complicating the inspection process.

Innovation Solution

An eddy current flaw detecting device and method that includes a probe scanning a standard piece with a shape matching the component surface, determining sensitivity based on eddy current changes across different scanning paths, and correcting signal intensity using a correction unit to account for probe sensitivity variations.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If a single probe shape is used for eddy current detection, then the device complexity is reduced, but the measurement precision deteriorates due to sensitivity variations caused by different component surface shapes

Engineering Contradiction:
Improveprobe replacement processVSAvoidprobe sensitivity
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The patent applies parameter changes by dynamically adjusting the detection frequency based on the surface shape of the component being inspected. The system identifies the surface shape category (flat, convex, concave, etc.) and selects an appropriate frequency from a predetermined set to maintain optimal probe sensitivity across different surface geometries, eliminating the need for physical probe replacement.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent implements dynamics by making the detection frequency adjustable and adaptive rather than fixed. The frequency selection changes in real-time based on the detected surface shape, allowing the system to dynamically optimize its performance for different inspection scenarios without requiring multiple static probe configurations.

Inventive Principle:
Principle #15Dynamics

2Measurement precision

If probe replacement is performed for different surface shapes, then the measurement precision is maintained, but the inspection process becomes more complicated and time-consuming

Engineering Contradiction:
Improveprobe sensitivityVSAvoidinspection process
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent uses copying by creating a database of predetermined frequencies corresponding to different surface shape categories. Instead of physically replacing probes, the system copies the optimal frequency parameters for each surface shape type and applies them automatically during inspection, simplifying the process while maintaining precision.

Inventive Principle:
Principle #26Copying

Solution Approach 2:

The system performs self-service by automatically detecting the surface shape and selecting the appropriate frequency without requiring manual intervention or probe replacement by the operator. The inspection process becomes autonomous, reducing complexity and time while maintaining measurement precision.

Inventive Principle:
Principle #25Self-service

3Measurement precision

If the probe frequency is adjusted for different surface shapes, then the measurement precision is maintained, but the device complexity increases due to additional frequency control mechanisms

Engineering Contradiction:
Improveprobe sensitivityVSAvoidfrequency control system
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent applies preliminary action by pre-establishing a database of frequencies corresponding to different surface shape categories before actual inspection. This preliminary preparation eliminates the need for complex real-time calculations during inspection, as the system only needs to match the detected surface shape to the appropriate pre-stored frequency.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The system manages device complexity by changing only the frequency parameter rather than requiring complex hardware modifications. The frequency adjustment is implemented through software control that selects from predetermined values, keeping the overall device structure relatively simple while achieving adaptive performance.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables more accurate and straightforward eddy current flaw detection without needing probe replacement, ensuring reliable detection of defects by adjusting signal intensity based on sensitivity variations.

Implementation Method 1

a probe (10) that scans a surface (51) of a standard piece (50), the surface having a shape corresponding to the component surface (41), along scanning paths (P) on the surface to be scanned having different shapes, and detects a change in a first eddy current on the surface (51) of the standard piece (50) in each of the scanning paths (P)

Methodology Applied
Scientific EffectEddy current: Eddy Currents

Implementation Method 2

detects a change in a first eddy current on the surface (51) of the standard piece (50) in each of the scanning paths (P)

Methodology Applied
Scientific EffectEddy current detection: Eddy Currents

Data Source

PatentUS20250224375A1Eddy current flaw detecting device, and eddy current flaw detecting method
Publication Date: 2025.07.10 IHI CORP
  • US20250224375A1 patent drawing
  • US20250224375A1 patent drawing
  • US20250224375A1 patent drawing

AI summary

An inspection device (1) includes a probe (10) that scans a surface (51) of a standard piece (50), the surface having a shape corresponding to a component surface (41), along scanning paths (P) on the surface to be scanned having different shapes, and detecting a change in a first eddy current on the surface (51) of the standard piece (50) in each of the scanning paths (P). The inspection device (1) includes a determination unit (21) that determines a sensitivity of the probe (10) in each of the scanning paths (P) based on an intensity of a first signal indicating a change in the first eddy current in each of the scanning paths (P). The inspection device (1) includes a correction unit (22) that corrects an intensity of a second signal indicating a change in a second eddy current on the component surface (41) detected by the probe (10) based on the sensitivity of the probe (10).