Eddy-Current Flaw Detection with Edge-Based Scan Correction
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing eddy-current flaw detection tests face inaccuracies due to incorrect determination of the position of the component or probe, leading to complicated processes to ensure accuracy.
Innovation Solution
An eddy-current flaw detection device and method that includes a storage unit to store the shape of the object, a probe to scan and detect eddy-current changes, a control unit to adjust the scanning path based on edge signals, and determination units to calculate offset amounts, ensuring precise positioning of the probe and edge detection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the position of the component or probe is incorrectly determined in the eddy-current flaw detection test, then the detection accuracy deteriorates, but performing complicated processes to ensure accuracy increases the device complexity and time consumption
Solution Approach 1:
The patent applies preliminary action by storing the shape data of the component and predetermined scanning paths in advance before the actual flaw detection process. This allows the system to quickly reference pre-prepared positional information during inspection, eliminating the need for complex real-time positioning calculations and procedures while maintaining high position determination accuracy.
2Measurement precision
If the position of the component or probe is incorrectly determined, then the detection accuracy deteriorates, but performing complicated processes to ensure accuracy increases the time consumption
Solution Approach 1:
The patent applies preliminary action by storing the shape data of the component and predetermined scanning paths in advance before the actual flaw detection process. This allows the system to quickly reference pre-prepared positional information during inspection, eliminating the need for complex real-time positioning calculations and procedures while maintaining high position determination accuracy.
3Reliability
If a probe scans a component surface to detect eddy-current changes, then flaw detection capability is improved, but incorrect position determination leads to inaccurate results
Solution Approach 1:
The patent applies feedback by using the stored component shape information and predetermined scanning paths to continuously monitor and adjust the probe position during scanning. The system compares the actual probe position with the predetermined path based on the stored shape data, providing feedback to maintain accurate positioning and ensure reliable flaw detection results.
Solution Approach 2:
The patent applies preliminary action by storing the shape data of the component and predetermined scanning paths in advance before the actual flaw detection process. This allows the system to quickly reference pre-prepared positional information during inspection, eliminating the need for complex real-time positioning calculations and procedures while maintaining high position determination accuracy.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables more accurate and simplified eddy-current flaw detection by determining the edge position and adjusting the scanning path, enhancing the reliability of defect detection on conductive objects.
Implementation Method 1
a probe (10) that scans a component surface (41) of the first object (40) and that detects a change in eddy-current
Data Source
AI summary
An eddy-current flaw detection device includes a storage unit that stores in advance a shape of a first object; and a probe that scans a component surface of the first object. The device includes a control unit that causes the probe to scan the component surface along a scanning path crossing an edge of the component surface. The device includes a first determination unit that determines a position of the edge in a scanning direction in which the scanning path P extends, based on an edge signal. The device includes a second determination unit that compares the position of the edge with a position of an edge of the first object stored in advance and determine a first offset amount in the scanning direction of the first object. The control unit offsets the scanning path in the scanning direction based on the first offset amount.