Eddy Current Probe With Shared Common Wiring
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Solution Overview
Problem
Conventional eddy current flaw detection probes require multiple switching circuits and complex wiring structures, hindering size reduction and manufacturing ease due to the need for separate connections for each coil, increasing the number of constituent elements and complicating the wiring structure.
Innovation Solution
The eddy current flaw detection probe is configured with multiple pairs of first and second coils arranged in a point symmetry, sharing common wirings and utilizing a single switching circuit for each unit of four coils, reducing the number of switching circuits and wirings, and allowing coils to alternate between excitation and detection functions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If each coil is connected to separate switching circuits for switching between excitation and detection states, then the coil functionality can be switched, but the number of constituent elements increases and the wiring structure becomes complicated
Solution Approach 1:
The patent combines multiple coils into groups where coils in the first row share a common first wiring and coils in the second row share a common second wiring. This merging of wiring paths reduces the total number of separate connections needed, thereby simplifying the wiring structure while maintaining the ability to switch between excitation and detection functions through the shared common wirings and switching circuits.
Solution Approach 2:
The patent implements a configuration where coils can serve multiple functions by being part of different groups. Coils in the first row function as excitation coils when energized, while coils in the second row function as detection coils when connected to the detection circuit. This universal design allows the same physical coil structure to perform different roles depending on its group assignment, reducing the need for separate dedicated circuits for each function.
2Ease of operation
If each coil is connected to different switching circuits, then individual coil control is achieved, but the probe size increases due to more constituent elements
Solution Approach 1:
The patent merges the wiring structure by implementing common first wirings for all coils in the first row and common second wirings for all coils in the second row. This consolidation reduces the number of separate wiring paths and constituent elements needed, thereby reducing the overall probe volume while maintaining individual coil control through the shared switching circuits that can selectively activate or deactivate specific coil groups.
3Adaptability or versatility
If multiple switching circuits are used for each row, then coil switching functionality is achieved, but manufacturing becomes more difficult
Solution Approach 1:
The patent merges multiple wiring paths into fewer common wirings, where all first-row coils share a common first wiring and all second-row coils share a common second wiring. This reduction in the number of separate wiring paths simplifies the manufacturing process by reducing the number of connection points, soldering operations, and assembly steps required, while still enabling full coil switching functionality through the shared switching circuits.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration results in a more compact and easier-to-manufacture probe with improved precision and reduced complexity in the wiring structure, enabling efficient flaw detection inspections while maintaining the precision of overlapping detection ranges.
Implementation Method 1
an eddy current flaw detection probe configured to perform a flaw detection inspection on an inspection target by generating eddy currents in the inspection target and detecting a change in the eddy currents
Implementation Method 2
first coils or second coils in each unit to serve as excitation coils that generate the eddy currents in the inspection target
Data Source
AI summary
An eddy current flaw detection probe includes first coils, second coils, and a switching circuit configured to cause the first or the second coils in each unit U, the unit U being composed of adjacent four coils, to serve as excitation coils that generate eddy currents in an inspection target and cause the other coils in the unit U to serve as detection coils that detect a change in the eddy currents. The first coils each have one end thereof connected to a first common wiring, and the second coils each have one end thereof connected to a second common wiring. The switching circuit includes a first switching circuit connected to the other ends of the first coils and the second coils arranged in a first row, and a second switching circuit connected to the other ends of the first coils and the second coils arranged in a second row.