Edge-Triggered Shift Register Latch for Single Scan Clock Tree

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Solution Overview

Problem

The existing LSSD testing methodology requires multiple clock trees, leading to significant wiring challenges and data loss due to signal delays in large-scale semiconductor integrated circuits, making it impractical to implement a single LSSD scan clock tree effectively.

Innovation Solution

The integration of edge-triggered shift register latches with a circuit element, such as an AND gate, to generate a second clock signal that compensates for delays, ensuring synchronized triggering of master and slave latches, thereby preventing data flush-through.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If a single LSSD scan clock tree is used to control scanning of test data, then wiring complexity and on-chip space are reduced, but signal path length variations cause timing delays that lead to data flush-through and loss

Engineering Contradiction:
Improvewiring complexityVSAvoiddata integrity
Core Design Contradiction:
Device complexityVSReliability

Solution Approach 1:

The patent applies preliminary action by generating a compensated clock signal in advance to offset anticipated timing delays. The delay compensation circuit pre-calculates and pre-adjusts the clock signal timing based on expected path variations, ensuring that all SRLs are triggered synchronously despite different physical distances from the clock source. This prevents data flush-through by ensuring master and slave latches are triggered at the correct relative times before data propagation occurs.

Inventive Principle:
Principle #10Preliminary action

2Reliability

If multiple clock trees are used to ensure synchronized triggering of master and slave latches, then data integrity is maintained, but wiring complexity and on-chip space requirements increase significantly

Engineering Contradiction:
Improvedata integrityVSAvoidwiring complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent merges the functions of multiple clock trees into a single clock distribution network. Instead of maintaining separate A-clock, B-clock, and C-clock trees, the invention combines their synchronization function into one clock tree with a delay compensation circuit that provides the necessary timing adjustments. This consolidation reduces wiring complexity and on-chip space while maintaining the synchronized triggering of master and slave latches through intelligent signal timing rather than physical separation.

Inventive Principle:
Principle #5Merging (Combining)

3Reliability

If signal path lengths to different SRLs are equalized, then synchronized triggering is achieved, but device layout flexibility and area utilization are reduced

Engineering Contradiction:
Improvetrigger synchronizationVSAvoidlayout flexibility
Core Design Contradiction:
ReliabilityVSArea of stationary object

Solution Approach 1:

The patent applies local quality by introducing delay compensation specifically where needed in the clock distribution path, rather than forcing uniform path lengths across the entire chip. The delay compensation circuit is placed locally at strategic points in the clock tree to adjust timing for specific regions or SRLs that experience varying path delays. This allows the rest of the device layout to maintain flexibility and optimal area utilization while only the necessary local regions receive timing adjustments.

Inventive Principle:
Principle #3Local quality

Data Source

PatentUS7543203B2LSSD-compatible edge-triggered shift register latch
Publication Date: 2009.06.02 GLOBALFOUNDRIES US INC
  • US7543203B2 patent drawing
  • US7543203B2 patent drawing
  • US7543203B2 patent drawing

AI summary

A shift register latch (SRL) (300, 304, 400) compatible with performing level sensitive scan design (LSSD) testing with a single scan clock (SCAN CLK) and single scan clock tree (64). The SRL includes a master latch (308, 308′, 404), a slave latch (312, 312′, 408) and a circuit element (328, 328′, 416) connected between the scan clock tree and the master latch. The scan clock generates a clock signal (350, 440) having regularly spaced pulses during the scan phase of the LSSD testing. The circuit element generates a short-pulsed signal (354, 354′) based on the scan clock signal for triggering the master latch. This short-pulsed signal compensates for any delay in the clock signal due to the physical length of the signal path from the scan clock to the SRL, thereby preventing scanned data from being flushed through a scan chain of the SRLs of the present invention