Electrically Programmable Fuse Programming Method

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Current electrically programmable fuses (EFUSEs) in integrated circuits have low information storage density and occupy large chip areas due to their limited two-state programming capability, which restricts their efficiency in information storage and circuit repair.

Innovation Solution

A method for programming EFUSEs that utilizes different programming conditions to change the conductive medium's physical state from a low resistance state to a medium resistance state and then to a high resistance state, achieving three information storage states by altering the programming time and pulse width, thereby improving storage density and chip area utilization.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If a single programming condition is used for EFUSE programming, then the programming process is simple, but the information storage density is low and chip area is large

Engineering Contradiction:
Improveprogramming process complexityVSAvoidinformation storage density
Core Design Contradiction:
Device complexityVSQuantity of substance

Solution Approach 1:

The patent applies parameter changes by introducing multiple programming conditions with different pulse widths and amplitudes to achieve different resistance states. Specifically, a first programming condition with a first pulse width programs the EFUSE to a medium resistance state, while a second programming condition with a second pulse width (different from the first) programs it to a high resistance state. This enables three-state storage (low, medium, high resistance) instead of traditional two-state storage, thereby improving information storage density without significantly complicating the programming process.

Inventive Principle:
Principle #35Parameter changes

2Device complexity

If a single programming condition is used for EFUSE programming, then the programming method is simple, but the chip area occupation is large

Engineering Contradiction:
Improveprogramming method complexityVSAvoidchip area
Core Design Contradiction:
Device complexityVSArea of stationary object

Solution Approach 1:

The patent resolves this contradiction by using parameter changes in the programming conditions to achieve three-state storage capability. By varying the pulse width and amplitude parameters of the programming signals, the system can store more information in the same physical space, thereby reducing chip area occupation while maintaining relatively simple programming methodology.

Inventive Principle:
Principle #35Parameter changes

3Quantity of substance

If multiple resistance states are achieved, then information storage density improves, but programming conditions become more complex

Engineering Contradiction:
Improveinformation storage densityVSAvoidprogramming conditions complexity
Core Design Contradiction:
Quantity of substanceVSDevice complexity

Solution Approach 1:

The patent manages programming condition complexity through systematic parameter changes. It defines specific relationships between pulse width and resistance state: a first pulse width range achieves medium resistance state, while a second pulse width range (distinct from the first) achieves high resistance state. This structured approach to parameter variation enables three-state storage while keeping the programming conditions manageable and distinguishable.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent employs periodic action through the use of programming pulses with specific time characteristics. The programming process utilizes pulsed signals with controlled widths and intervals to transition the EFUSE between different resistance states. This periodic pulsing mechanism provides a systematic way to achieve multiple states without requiring continuously varying complex waveforms.

Inventive Principle:
Principle #19Periodic action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach significantly enhances information storage density and chip area utilization, facilitating reduced chip sizes by enabling transitions between three resistance states through distinct programming conditions.

Implementation Method 1

In an EFUSE programming process, electro-migration or thermal fusing occurs in the fuse link, so that the resistance of the fuse link is changed from a low resistance state to a high resistance state.

Methodology Applied
Scientific EffectElectro-migration:

Implementation Method 2

In an EFUSE programming process, electro-migration or thermal fusing occurs in the fuse link, so that the resistance of the fuse link is changed from a low resistance state to a high resistance state.

Methodology Applied
Scientific EffectThermal fusing: Melting

Data Source

PatentUS10714200B2Method for programming electrically programmable fuse
Publication Date: 2020.07.14 WUHAN XINXIN SEMICON MFG CO LTD
  • US10714200B2 patent drawing
  • US10714200B2 patent drawing

AI summary

A method for programming an electrically programmable fuse is disclosed. As conductive medium of the electrically programmable fuse exhibits different physical changes under different conditions, the conductive medium is changed from an initial physical state to a first physical state by using a first programming condition to program the electrically programmable fuse from a low resistance state to a medium resistance state, and the conductive medium is changed from the initial physical state or the first physical state to a second physical state by using a second programming condition to program the electrically programmable fuse from the low resistance state or the medium resistance state to a high resistance state. Transitions of three information storage states are achieved through two different programming conditions, so that the information storage density and chip area utilization rate of an electrically programmable fuse device can be significantly improved, and chip size reduction is facilitated.